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energy-dispersive X-ray spectrometers

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Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... on the operating principles and applications of detectors for x-ray spectroscopy, namely energy-dispersive spectrometers, wavelength-dispersive spectrometers, and handheld x-ray fluorescence systems. The processes involved in x-ray analysis in the SEM and handheld x-ray fluorescence analysis are then covered...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.homegoods.c9001622
EISBN: 978-1-62708-222-8
...) failure A stamped coin exhibited visible discolored areas, seen as a tan haze on the surface ( Fig. 1 ). In this case, the discoloration was considered merely cosmetic. The nonstained and stained regions were studied using a scanning electron microscope equipped with an energy-dispersive X-ray...
Series: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001269
EISBN: 978-1-62708-215-0
... microscope (SEM) equipped with a light element detecting energy dispersive x-ray spectrometer (EDS) was used to examine the freshly fractured surfaces, fractured teeth and TiN surface. The EDS detector is capable of detecting elements with atomic numbers of sodium and above. Elements boron and above...
Series: ASM Failure Analysis Case Histories
Volume: 1
Publisher: ASM International
Published: 01 December 1992
DOI: 10.31399/asm.fach.v01.c9001088
EISBN: 978-1-62708-214-3
...-Dispersive X-ray Spectrometer Analysis Specimen Selection Visual Examination of General Physical Features Metallography Scanning Electron Microscope Fractography Chemical Analysis/Identification Mechanical Properties Hardness A Knoop microhardness trasverse revealed hardnesses of 35...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... of detector was developed that, with no moving parts, could simultaneously count and determine the energy of the x-rays ( Fig. 6 ). These detectors are the ones used for EDS modules on SEM devices. Fig. 5 Schematic diagram of the components of a wavelength-dispersive x-ray spectrometer Fig. 6...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001845
EISBN: 978-1-62708-241-9
... (5 g FeCl 3 + 50 ml HCl + 500 ml deionized water) was applied to reveal the microstructure. Cleaning was performed using ethanol followed by hot air stream drying. Fractographic observation was conducted using a scanning electron microscope equipped with an energy-dispersive X-ray spectrometer...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.steel.c9001490
EISBN: 978-1-62708-232-7
... Around the perimeter of the hole the steel exhibited a very unusual set of microstructural bands, Figures 5 , 6 , and 7 . Based on the appearance and on energy-dispersive x-ray (EDX) microprobe spectra, Figures 8 and 7 , and on the wavelength spectrometer analysis of oxygen, Figure 9...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
...: EDS, energy-dispersive spectroscopy; WDS, wavelength-dispersive spectroscopy; AES, Auger electron spectroscopy; XPS, x-ray photoelectron spectroscopy; TOF-SIMS, time-of-flight secondary ion mass spectrometry; FTIR, Fourier transform infrared (spectroscopy) Understanding the various analytical...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
... that can simultaneously count and determine the energy of emitted x-rays. Such an energy-dispersive detector contrasts with the wavelength-dispersive spectrometers used on the original electron probe microanalyzer developed by Castaing in 1948. The x-rays are generated when a sample of the area of interest...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006757
EISBN: 978-1-62708-295-2
... Analysis Energy-dispersive x-ray analysis is normally conducted using an SEM fitted with an x-ray detector that can simultaneously count and determine the energy of emitted x-rays. Such an energy-dispersive detector contrasts with the wavelength-dispersive spectrometers used on the original electron...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... materials is seldom performed. A competing process to Auger electron generation is that of x-ray emission, the analytical signal for the technique known as energy-dispersive x-ray spectroscopy (EDS). In general, x-ray emission is more pronounced for heavier elements, while the probability of Auger...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001798
EISBN: 978-1-62708-241-9
... infrared spectrometer (FTIR), x-ray energy dispersive spectrum (EDS), and differential scanning calorimetry coupled with thermogravimetric analyzer (DSC-TGA). In order to build the fault tree of the failure of the encapsulant, the curing process and storage procedure should be analyzed theoretically...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006766
EISBN: 978-1-62708-295-2
.... If this information is not available, rapid, nondestructive, semiquantitative techniques such as energy-dispersive x-ray spectroscopy (EDS) and portable x-ray fluorescence (XRF) tools can be used to estimate the material composition in order to allow the chemical analyst to determine the proper techniques...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
..., but it was still used in the failure investigation to determine if the α case played a role in failure. Fig. 8 Typical x-ray photoelectron spectroscopy (a) binding energy, (b) depth profile spectra showing the atomic percentage change for various elements as a function of etch time. The binding energy...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006943
EISBN: 978-1-62708-395-9
... Depth of analysis, depth of profiling, and length scale presentation in surface examination and analysis of polymers. AFM, atomic force microscopy; SEM, scanning electron microscopy; XPS, x-ray photoelectron spectroscopy; ToF-SIMS, time-of-flight secondary ion mass spectrometry; EDS, energy-dispersive...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.chem.c9001687
EISBN: 978-1-62708-220-4
... the formation of microvoids at the oxide/matrix interface (b). Wave dispersive spectrometer analyses indicate that the film is not chemically homogeneous and it contains 50–58wt%Cr, 1–6wt%Mn, 7–10wt%Fe and the balance oxygen, that is, its chemical formula can be expressed as Cr 3−x (Mn,Fe) x O 4 with x...
Series: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001329
EISBN: 978-1-62708-215-0
... of x-rays emitted from a sample is accomplished using crystal spectrometers, which use energy-dispersive techniques that permit analysis by discriminating among X-ray energies. The feature of electron-beam microanalysis that best describes this technique is its mass sensitivity. For example...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.conag.c9001633
EISBN: 978-1-62708-221-1
..., and zinc. The brown stain is assumed to be primarily iron oxide (the EDS system does not capture X-ray emissions from oxygen). Scanning electron microscopy fractograph and optical fractograph of the flat oxidized portions of the fracture surface ( Fig. 9 and 10 ) are consistent with a ductile fatigue...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001811
EISBN: 978-1-62708-241-9
.... The microstructure of the tube was found to be homogenous and had no banded structure. However, x-ray diffraction analysis confirmed the presence of up to 6% retained austenite which likely caused the tube to buckle during the 910 °C heat treating procedure. References References 1. Kernand R.F...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006933
EISBN: 978-1-62708-395-9
... mode Energy-dispersive x-ray spectroscopy (EDS) Elemental concentrations Material composition, fillers, additives Nuclear magnetic resonance (NMR) Molecular bond structure Material identification Mass spectroscopy (MS) Molecular structure Material identification, additives X-ray...