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electron probe X-ray microanalysis

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Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.modes.c0046371
EISBN: 978-1-62708-234-1
... any stainless steel from the spacer. Other items for investigation were the nature of the bond between the galled spot and the inner cone and any evidence of overtempering or rehardening resulting from localized overheating. Analysis (visual inspection, electron probe x-ray microanalysis, microscopic...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.auto.c0046981
EISBN: 978-1-62708-218-1
.... Analysis (visual inspection, electron probe x-ray microanalysis, hardness testing, 4.5x fractograph) supported the conclusions that failure of the valve stem occurred by fatigue as a result of a combination of a nonuniform bending load, which caused a mild stress-concentration condition, and a high...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.modes.c0046991
EISBN: 978-1-62708-234-1
..., which resulted from heating during welding. Electron probe x-ray microanalysis showed the outside surface of the tube did not have the protective chromium oxide scale normally found on Incoloy 800. The inside surface of the tube had a thin chromium oxide protective scale. This evidence supported...
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Published: 01 January 2002
Fig. 6 Schematic of a complete energy-dispersive x-ray spectrometer used in electron-probe x-ray microanalysis. Various pulse processing functions and the multichannel analyzer are shown. FET, field effect transistor More
Image
Published: 01 June 2019
Fig. 1 Evidence of galling, or adhesive wear, on the inner surface of a carburized 4720 steel inner cone of a roller bearing. Galling was confirmed by the use of electron probe x-ray microanalysis. More
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.homegoods.c0049838
EISBN: 978-1-62708-222-8
... correspond to specific intermetallic compounds that are found in the aluminum-iron phase diagram. X-ray microanalysis of reaction zone at the aluminum wire/steel screw interface shown in <xref rid="c0049838-f2" ref-type="fig">Fig. 2(a)</xref> Table 1 X-ray microanalysis of reaction zone...
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Published: 01 June 2019
Fig. 9 Electron probe microanalysis (EPMA) scans of brittle alumina stringers observed in the failed converter bearing sample. (a) Backscattered electron (BSE) image; (b) O 2 X-ray map; (c) Al X-ray map. All, 600× More
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
... spectroscopy (EDS), electron probe microanalysis (EPMA), Auger electron spectroscopy (AES), secondary ion mass spectroscopy (SIMS), and x-ray powder diffraction (XRPD). Energy-Dispersive X-Ray Analysis Energy-dispersive x-ray analysis is normally conducted using a SEM fitted with an x-ray detector...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.steel.c9001535
EISBN: 978-1-62708-232-7
.... Microstructural issues influencing roll quality, such as characteristics of carbides, tempered martensite, retained austenite, etc., have been extensively studied through optical and scanning electron microscopy, electron-probe microanalysis, image analysis, and x-ray diffractometry. These are discussed...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... • Newbury D.E. and Ritchie N.W.M. , Electron Probe X-Ray Microanalysis , Materials Characterization , Vol 10 , ASM Handbook , ASM International , 2019 , 10.31399/asm.hb.v10.a0006638 ...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... spectrometer and was the model for the first commercial systems (see the article “Electron Probe X-Ray Microanalysis” in Materials Characterization Volume 10 of ASM Handbook. These systems consisted of an x-ray detector and single-crystal diffractometers that moved synchronously around the sample...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.steel.c9001645
EISBN: 978-1-62708-232-7
...× Fig. 8 Energy-dispersive spectrometric (EDS) analysis of inclusion observed at the crack site on the fracture surface of the failed converter bearing sample, showing Ca, Al, and Si X-ray peaks indicating the presence of silicate inclusion Electron Probe Microanalysis Electron probe...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.petrol.c9001247
EISBN: 978-1-62708-228-0
.... 6 Inside surface of sample 2 showing general attack and precipitation effects. Etched with 10% oxalic acid. 500 × The results of electron probe microanalysts of a section taken from the unmarked sample are illustrated in the form of electron and X-ray images in Fig. 7 . These results...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... of the electron probe. A reasonable estimate for the smallest area that can be sampled using x-rays is a 1 μm cube. Fig. 8 Simulation of beam spreading of 20 keV electrons in zinc The condition of the sample surface and the orientation of the surface with respect to the detector greatly affect both...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... electron signals for imaging, and the characteristic x-ray signal emitted from the sample for composition identification. Secondary Electrons Secondary electrons are low-energy electrons emitted from the sample as a result of coulombic interactions between the incident electrons from the beam...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006943
EISBN: 978-1-62708-395-9
... Abstract This article discusses the operating principles, advantages, and limitations of scanning electron microscopy, atomic force microscopy, x-ray photoelectron spectroscopy, and secondary ion mass spectroscopy that are used to analyze the surface chemistry of plastics. atomic force...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0006548
EISBN: 978-1-62708-180-1
... modulus or modulus of elasticity; energy E elastic or storage modulus E viscous or loss modulus EAC environmentally assisted cracking EBSP electron backscattered pattern ECT equicohesive temperature EDM electric discharge machining EDS energy dispersive spectroscopy EDX energy-dispersive x-ray (analysis...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.9781627081801
EISBN: 978-1-62708-180-1
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
... and any other facets of the techniques that would not be known by the customer. Surface Chemical Analysis Failure investigations where the surface of the subject part is important can include surface chemical analysis techniques such as x-ray photoelectron spectroscopy (XPS), or electron...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.petrol.c9001603
EISBN: 978-1-62708-228-0
... of a crack with embedded inclusions. X-ray analysis confirmed the presence of Fe, Si, Ca, and O ( Fig. 3 ). Fig. 3 (a) SEI photomicrograph of an inclusion embedded within a crack and X-ray analysis of (b) Fe, (c) Si, (d) Ca, and (e) O Inclusion entrapment can occur during steelmaking, casting...