1-5 of 5 Search Results for

digital semiconductors devices

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006764
EISBN: 978-1-62708-295-2
... noise Changes in magnetic flux from stress applied to magnetic material Online monitoring of magnetic material Not suitable for nonmagnetic material Online monitoring; can sense stress without cracking Magnetic metals, steel, nickel, iron, chrome Radiography, computed tomography, digital x-ray...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006766
EISBN: 978-1-62708-295-2
... and qualitative determination of primary and trace elemental constituents in metal alloys. Optical emission spectroscopy is also used for a variety of other analyses, including: Fast elemental depth profiling of technical coatings Determination of trace impurity concentrations in semiconductor materials...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
..., imaging Limitations Semiconductive Very few Quantification difficult Major applications Semiconductors, electronics All industries Polymers, contamination, trace metal analysis Evaluation techniques for chemical characterization of surfaces Table 1 Evaluation techniques for chemical...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... for a fixed objective aperture size. Modern digital microscopes can compensate for this signal loss to a certain extent by frame averaging, which allows an image to be acquired over the course of any number of scans. An improper understanding of the trade-off between resolution and signal strength...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... probe size is only accomplished with a concomitant loss in signal strength for a fixed objective aperture size. Modern digital microscopes can compensate for this signal loss to a certain extent by frame averaging, which allows an image to be acquired over the course of any number of scans. An improper...