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Jude M. Runge-Marchese
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chlorendic resins
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Book Chapter
Abbreviations—Characterization and Failure Analysis of Plastics
Available to PurchaseSeries: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006945
EISBN: 978-1-62708-395-9
... Association computed tomography; compact tension coef cient of thermal expansion chlorotri uoroethylene crack tip opening displacement Diallyl chlorendate; distance amplitude correction diallyl phthalate ductile-brittle transition temperature dynamic dielectric analysis diaminodiphenylsulfone design...
Abstract
This article is a compilation of abbreviations of terms, techniques, standards, compounds, and properties of materials that are relevant to the characterization and failure analysis of plastics.
Book Chapter
Termination Delamination of Surface-Mount Chip Resistors
Available to PurchaseSeries: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001391
EISBN: 978-1-62708-215-0
... resin at a temperature of 250°C (480°F); a recommended operating range of 240 to 260°C (465 to 500°F) was specified. Valox is a General Electric polymer blend of Lexan, a GE polycarbonate, and polybutylene terepthalate. Changes in resistance were often measured after solder attachment...
Abstract
Several surface-mount chip resistor assemblies failed during monthly thermal shock testing and in the field. The resistor exhibited a failure mode characterized by a rise in resistance out of tolerance for the system. Representative samples from each step in the manufacturing process were selected for analysis, along with additional samples representing the various resistor failures. Visual examination revealed two different types of termination failures: total delamination and partial delamination. Electron probe microanalysis confirmed that the fracture occurred at the end of the termination. Transverse sections from each of the groups were examined metallographically. Consistent interfacial separation was noted. Fourier transform infrared and EDS analyses were also performed. It was concluded that low wraparound termination strength of the resistors had caused unacceptable increases in the resistance values, resulting in circuit nonperformance at inappropriate times. The low termination strength was attributed to deficient chip design for the intended materials and manufacturing process and exacerbated by the presence of polymeric contamination at the termination interface.
Book
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.9781627083959
EISBN: 978-1-62708-395-9