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atomic force microscopy

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Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0006548
EISBN: 978-1-62708-180-1
...Abbreviations and Symbols a crack length ac critical crack length at.% atomic percent A area; ratio of the alternating stress amplitude to the mean stress A cross-sectional area of weld A angstrom Accm in hypereutectoid steel, temperature at which cementite completes solution in austenite Ac1...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.9781627081801
EISBN: 978-1-62708-180-1
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006811
EISBN: 978-1-62708-329-4
... are intended to undergo cyclic loads from repeated body motion, the risk of fatigue fracture exists, similar to any engineered component subject to such an environment. For knee and hip implants, these forces are generally caused by weight-bearing loads associated with daily activities such as walking, stair...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.mech.c9001721
EISBN: 978-1-62708-225-9
... in the brittle failure of a normally ductile material. Many different mechanisms have been proposed to explain the phenomena of SCC and propagation of the crack. Some of the more popular ones include: hydrogen embrittlement, adsorption induced cleavage, atomic surface mobility, film rupture, and film induced...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... Abstract The scanning electron microscopy (SEM) is one of the most versatile instruments for investigating the microstructure of metallic materials. This article highlights the development of SEM technology and describes the operation of basic systems in an SEM, including the electron optical...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... preparation scanning electron microscope scanning electron microscopy THE SCANNING ELECTRON MICROSCOPE (SEM) is one of the most versatile instruments for investigating the microscopic features of most solid materials. Compared to the light microscope, it expands the resolution range by more than 1...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... electron must be high enough to overcome the binding force that holds the electron to the atom whose ejection starts the process of x-ray emission. For example, if a copper K α x-ray of 8.04 keV of energy is to be generated, then an amount of energy greater than 8.04 keV must be absorbed by the atom...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.modes.c9001632
EISBN: 978-1-62708-234-1
..., containing a beam stop. The protons induce radiation damage effects in the window by displacing atoms, enhancing diffusion, and creating impurity atoms through nuclear reactions. During its service life, the window, which is the subject of this report, received a maximum damage level of 20 displacements per...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001830
EISBN: 978-1-62708-241-9
... 0.45–0.7 0.8–1.15 0.5–0.65 0.25–0.35 Vickers Hardness Measured on Four Points of the Bolt Table 3 Vickers Hardness Measured on Four Points of the Bolt Position Force, kgf Hardness, HV Point 1 10 285 Point 2 10 285 Point 3 10 289 Point 4 10 292 Mechanical...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003532
EISBN: 978-1-62708-180-1
..., exhibit poor contrast in the SEM and are best viewed by light microscopy. When atomic number contrast or topographic contrast is strong, the SEM provides good structural images, particularly above 500× ( Ref 3 ). Again, because of the limitations and advantages of each instrument, they are complementary...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006761
EISBN: 978-1-62708-295-2
... mechanical properties on a very small scale, with features less than 100 nm across. It is used in conjunction with atomic force microscopy. There is currently debate regarding the reliability and efficacy of the data obtained using this technique; thus, great care should be taken with the use of these data...
Series: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001269
EISBN: 978-1-62708-215-0
... examination. Surprisingly, the clamping force of the vise and stress from sectioning was sufficient to cause additional multiple fractures. Scanning Electron Microscopy/EDS A Leica S-200 scanning electron microscope (SEM) equipped with a light element detecting energy dispersive x-ray spectrometer (EDS...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006765
EISBN: 978-1-62708-295-2
... magnification range as the LM, but examination with the latter is more efficient. Contrast mechanisms for viewing microstructures are different for the LM and SEM. Many microstructures, for example, tempered martensite, exhibit poor contrast in the SEM and are best viewed by light microscopy. When atomic number...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006794
EISBN: 978-1-62708-295-2
... rods and slide bearings, and facilities used in an offshore corrosive environment can suffer from tribocorrosion fatigue. During fatigue wear corrosion processes, wear, corrosion, and fatigue occur simultaneously. Wear is caused by cyclic wearing force in combination with corrosion. Note...
Series: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001339
EISBN: 978-1-62708-215-0
... ultrasonic procedure similar to the Electric Power Research Institute intergranular crack detection procedures was used to detect the branch cracking. Surface Examination Visual The through-wall crack was sectioned out of the pipe/elbow weld (W-3) and opened by applying a bending force to the pipe...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003543
EISBN: 978-1-62708-180-1
... atoms typically result in a crystalline structure, which in most engineering metals are face-centered cubic (fcc), body centered cubic (bcc), or hexagonal close-packed (hcp) structures. The formation of crystal lattices occurs as a result of bonding between atoms. Strong bonding forces between atoms...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006778
EISBN: 978-1-62708-295-2
... of crystal lattices occurs as a result of bonding between atoms. Strong bonding forces between atoms cause atoms to pack efficiently (high packing densities). These arrangements exhibit planes of high atomic density, which contain close-packed directions. This results in the three lattices (fcc, bcc, and hcp...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003542
EISBN: 978-1-62708-180-1
... (SEM), transmission electron microscopy, atomic force microscopy, and other specialized methods. The bulk of the observations by far are done with low-magnification optical microscopy, often using a stereographic microscope, and with higher-magnification SEM. The primary goal of most fractographic...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
.... Common wet chemical analysis methods for metals include atomic absorption, where a beam of light is directed through a solution of known concentration prepared by dissolving metal chips in the proper acid mixture. The light is absorbed preferentially at certain wavelengths by certain elements. Thus...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.power.c9001004
EISBN: 978-1-62708-229-7
... bearing thread. Crack extension was the result of marked creep embrittlement and reverse temper embrittlement (RTE). Selected approaches were examined to assess the effects of RTE on the material toughness of selected studs. It was observed that Auger electron microscopy results which indicated the extent...