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X-ray photoelectron spectroscopy

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Published: 01 January 2002
Fig. 4 X-ray photoelectron spectroscopy survey spectrum of stainless steel surface More
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Published: 01 January 2002
Fig. 5 X-ray photoelectron spectroscopy high-resolution spectrum of polyethylene terephthalate (PET) More
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Published: 01 January 2002
Fig. 6 X-ray photoelectron spectroscopy compositional depth profile of stainless steel More
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Published: 01 January 2002
Fig. 10 X-ray photoelectron spectroscopy high-resolution carbon spectrum of stainless steel surface More
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Published: 01 January 2002
Fig. 11 X-ray photoelectron spectroscopy high-resolution iron spectrum of stainless steel surface More
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Published: 01 January 2002
Fig. 12 X-ray photoelectron spectroscopy high-resolution iron spectrum obtained from well-passivated stainless steel surface More
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Published: 01 January 2002
Fig. 13 X-ray photoelectron spectroscopy montage display of iron in the first eight sputter cycles of the depth profile (Fig. 6) More
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Published: 01 January 2002
Fig. 14 X-ray photoelectron spectroscopy montage display of Cr in the first nine sputter cycles of the depth profile (Fig. 6) More
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
...: EDS, energy-dispersive spectroscopy; WDS, wavelength-dispersive spectroscopy; AES, Auger electron spectroscopy; XPS, x-ray photoelectron spectroscopy; TOF-SIMS, time-of-flight secondary ion mass spectrometry; FTIR, Fourier transform infrared (spectroscopy) Auger electron spectroscopy atomic...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... Abstract This article covers the three most popular techniques used to characterize the very outermost layers of solid surfaces: Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Some of the more important...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006943
EISBN: 978-1-62708-395-9
... Abstract This article discusses the operating principles, advantages, and limitations of scanning electron microscopy, atomic force microscopy, x-ray photoelectron spectroscopy, and secondary ion mass spectroscopy that are used to analyze the surface chemistry of plastics. atomic force...
Series: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001354
EISBN: 978-1-62708-215-0
..., primarily intergranular were found on the inlet and outlet faces along prior-austenite grain boundaries. The cracks initiated at the surface and propagated inward. Multiple crack branching was observed. Many of the cracks were filled with iron oxide. X-ray photoelectron spectroscopy indicated the presence...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.modes.c9001628
EISBN: 978-1-62708-234-1
... photoelectron spectroscopy (XPS). This technique is able to detect elements above Atomic No. 2 on the Periodic Table, from the surface to approximately 40 Ă… below the surface. The incident beam consists of X-rays, which, unlike electrons, do not affect the surface being analyzed. X-ray photoelectron...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.process.c0045926
EISBN: 978-1-62708-235-8
... and bad samples. X-ray photoelectron spectroscopy was used because the results would not be affected by the nonconducting epoxy. Fig. 1 Optical photograph of a peel test sample partially peeled to reveal the underside of the conversion-coated nickel-phosphorus laminate. Results Results...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006945
EISBN: 978-1-62708-395-9
... Underwriter s Laboratory unsaturated polyester ultraviolet vinyl acetate vinyl chloride vinylidene chloride vacuum hot pressing WDS XMC XPS XRD wavelength dispersive spectroscopy extra-high-strength molding compound X-ray photoelectron spectroscopy X-ray diffraction analysis ACKNOWLEDGMENT This article...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.9781627081801
EISBN: 978-1-62708-180-1
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0006548
EISBN: 978-1-62708-180-1
... percentage by volume of austenite VC percentage by volume of undissolved ce- mentite Vc volume of untransformed austenite WDS wavelength-dispersive spectroscopy WES Welding Engineering Society wt% weight percent WQ water quenching XPS x-ray photoelectron spectroscopy XRD x-ray diffraction XRDC x-ray powder...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
... and any other facets of the techniques that would not be known by the customer. Surface Chemical Analysis Failure investigations where the surface of the subject part is important can include surface chemical analysis techniques such as x-ray photoelectron spectroscopy (XPS), or electron...
Series: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001318
EISBN: 978-1-62708-215-0
... of a sulfur peak. Fig. 15 EDS spectrum (high-energy band) representative of areas on or near fracture surfaces of two failed discs. Hg indications are barely above background. X-ray photoelectron spectroscopy (XPS) and scanning auger microprobe (SAM) analysis were used to corroborate the EDS...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006931
EISBN: 978-1-62708-395-9
... size and shape, long-range periodicity Scanning electron microscopy (SEM) Surface and particle morphology Particle size and shape, surface features Transmission electron microscopy Polymer morphology Polymer features and defects X-ray photoelectron spectroscopy (XPS) Elemental...