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X-ray photoelectron spectroscopy

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Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
...: EDS, energy-dispersive spectroscopy; WDS, wavelength-dispersive spectroscopy; AES, Auger electron spectroscopy; XPS, x-ray photoelectron spectroscopy; TOF-SIMS, time-of-flight secondary ion mass spectrometry; FTIR, Fourier transform infrared (spectroscopy) Auger electron spectroscopy atomic...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... silicide at the interface of the nickel film and silicon wafer Fig. 4 Auger electron spectroscopy overlay map of the sample surface showing multiple elements: carbon (red), nickel (blue), and silicon (green). FOV, field of view Fig. 5 X-ray photoelectron spectroscopy survey spectrum...
Series: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001354
EISBN: 978-1-62708-215-0
.... Multiple cracks, primarily intergranular were found on the inlet and outlet faces along prior-austenite grain boundaries. The cracks initiated at the surface and propagated inward. Multiple crack branching was observed. Many of the cracks were filled with iron oxide. X-ray photoelectron spectroscopy...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.modes.c9001628
EISBN: 978-1-62708-234-1
..., further analyses were performed using X-ray photoelectron spectroscopy (XPS). This technique is able to detect elements above Atomic No. 2 on the Periodic Table, from the surface to approximately 40 Å below the surface. The incident beam consists of X-rays, which, unlike electrons, do not affect...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.process.c0045926
EISBN: 978-1-62708-235-8
... of peel test samples. These samples were compared with normal-strength samples using XPS by analyzing the surface chemistry of the exposed underside of the conversion-coated nickel-phosphorus layer after it was peeled away from the epoxy for both good and bad samples. X-ray photoelectron spectroscopy...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
... surface chemical analysis techniques such as x-ray photoelectron spectroscopy (XPS), or electron spectroscopy for chemical analysis, and Auger electron spectroscopy. Depth profiling through layers in the nanometer to micron range allows for chemical analysis into a material. These techniques are used...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.9781627081801
EISBN: 978-1-62708-180-1
Series: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001318
EISBN: 978-1-62708-215-0
... of a sulfur peak. Fig. 15 EDS spectrum (high-energy band) representative of areas on or near fracture surfaces of two failed discs. Hg indications are barely above background. X-ray photoelectron spectroscopy (XPS) and scanning auger microprobe (SAM) analysis were used to corroborate the EDS...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006786
EISBN: 978-1-62708-295-2
... depth of the electron beam. This layer can also be detected by other surface analytical techniques, such as Auger electron spectroscopy (AES), electron spectroscopy for chemical analysis (ESCA), or x-ray photoelectron spectroscopy (XPS). Evaluation of the embrittled material surface is not very easy...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003525
EISBN: 978-1-62708-180-1
... mode Energy dispersive x-ray spectroscopy (EDS) Elemental concentrations Material composition, fillers, additives Nuclear magnetic resonance (NMR) Molecular bond structure Material identification Mass spectroscopy (MS) Molecular structure Material identification, additives X-ray...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
... electron microscopy (TEM) Polymer morphology X-ray photoelectron spectroscopy (XPS) Elemental concentrations, oxidation states Auger electron spectroscopy (AES) Elemental concentrations Wavelength dispersive x-ray analysis Elements present on polymer surfaces Source: Ref 6...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006757
EISBN: 978-1-62708-295-2
... electron microscopy (TEM) Polymer morphology X-ray photoelectron spectroscopy (XPS) Elemental concentrations, oxidation states Auger electron spectroscopy (AES) Elemental concentrations Wavelength dispersive x-ray analysis Elements present on polymer surfaces Source: Ref 7...
Series: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001357
EISBN: 978-1-62708-215-0
.... Table 1 presents the results of the analysis; spectrums obtained by Auger electron spectroscopy and X-ray photoelectron microscopy (XPS) are shown respectively in Fig. 9 and 10 . Results of electron spectroscopy at two different Table 1 Results of electron spectroscopy at two different...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006789
EISBN: 978-1-62708-295-2
... Worn surfaces Visual inspection, roughness profiles Optical microscopy Scanning electron microscopy equipped with energy-dispersive x-ray spectroscopy X-ray diffraction and advanced techniques (such as x-ray photoelectron spectroscopy, Raman and Auger spectroscopy) Subsurface regions...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.marine.c9001617
EISBN: 978-1-62708-227-3
... ). For inboard couplings, on the other hand, there were generally little or no signs of corrosion on fracture surfaces, and x-ray photoelectron spectroscopy of fracture surfaces did not reveal any evidence of residual contaminants. For longitudinal cracks, the texture of the fracture surface reflected...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006764
EISBN: 978-1-62708-295-2
... noise Changes in magnetic flux from stress applied to magnetic material Online monitoring of magnetic material Not suitable for nonmagnetic material Online monitoring; can sense stress without cracking Magnetic metals, steel, nickel, iron, chrome Radiography, computed tomography, digital x-ray...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006785
EISBN: 978-1-62708-295-2