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X-ray absorption spectroscopy

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Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
...Abstract Abstract X-ray spectroscopy is generally accepted as the most useful ancillary technique that can be added to any scanning electron microscope (SEM), even to the point of being considered a necessity by most operators. While “stand-alone” x-ray detection systems are used less...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.homegoods.c9001622
EISBN: 978-1-62708-222-8
... Atomic No. 5 on the periodic table. When the primary electron beam strikes the sample, the atoms in the sample interact with the beam in various ways. One interaction causes the emission of the X-rays by the atoms in the sample. Each element has characteristic energy levels at which the X-rays...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006766
EISBN: 978-1-62708-295-2
.... The discussion covers the operating principles, applications, advantages, and disadvantages of optical emission spectroscopy (OES), inductively coupled plasma optical emission spectroscopy (ICP-OES), X-ray spectroscopy, and ion chromatography (IC). In addition, information on combustion analysis and inert gas...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.modes.c0090460
EISBN: 978-1-62708-234-1
... been injection molded from a 30% glass-fiber and mineral-reinforced nylon 12 resin. Investigation, including visual inspection, 118x SEM images, 9x micrographs, energy-dispersive x-ray spectroscopy, micro-FTIR in the ATR mode, and TGA, supported the conclusion that the filter component failed...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
.../Intermetallics Bulk chemical analysis of ceramic and intermetallic components that have failed may be made in several ways, including wet analytical chemistry, ultraviolet/visible absorption spectroscopy, and molecular fluorescence spectroscopy. Additionally, x-ray diffraction analysis is particularly...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006757
EISBN: 978-1-62708-295-2
...) spectroscopy Chemical shift of nuclei Mass spectroscopy Mass/charge of ions produced X-ray diffraction analysis (XRD) Crystalline polymer component Small-angle x-ray diffraction X-ray scattering at low angle Scanning electron microscopy (SEM) Surface and particle morphology Transmission...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003525
EISBN: 978-1-62708-180-1
... mode Energy dispersive x-ray spectroscopy (EDS) Elemental concentrations Material composition, fillers, additives Nuclear magnetic resonance (NMR) Molecular bond structure Material identification Mass spectroscopy (MS) Molecular structure Material identification, additives X-ray...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... depth of analysis is approximately 5 nm. X-ray photoelectron spectroscopy is accomplished by flooding the sample with x-rays of a known energy (typically Mg Kα at 1253.6 eV or monochromated Al Kα at 1486.7 eV). Absorption of these x-rays by the sample atoms causes photoelectrons to be emitted...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
...Abstract Abstract This article covers the three most popular techniques used to characterize the very outermost layers of solid surfaces: Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Some of the more...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.petrol.c9001638
EISBN: 978-1-62708-228-0
...Abstract Abstract An Incoloy 800H (UNS N08810) transfer line on the outlet of an ethane-cracking furnace failed during decoking of the furnace tubes after nine years in service. A metallographic examination using optical and scanning electron microscopy as well as energy-dispersive x-ray...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001798
EISBN: 978-1-62708-241-9
... of the failure, a Fault Tree was theoretically built, and the structural variations of the failed encapsulant were characterized compared with the normal encapsulant, using Fourier-transform infrared spectrometer (FTIR), x-ray energy dispersive spectrum (EDS), and differential scanning calorimetry coupled...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006782
EISBN: 978-1-62708-295-2
... technique for quantitative elemental analysis, comparing it to a standard solution, and the argon plasma-excitation source is used to generate a signal at the analytical wavelength for each element. The accuracy of the analysis is 0.01 wt% of the measured value. X-ray fluorescence spectroscopy...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006764
EISBN: 978-1-62708-295-2
... in service, based on surface analysis for residue of penetrant on the crack faces. Micro-Fourier transform infrared spectroscopy, x-ray photoelectron spectroscopy, and secondary ion mass spectroscopy are very sensitive chemical analysis techniques that have been used to test for penetrant residue on crack...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
...-dispersive x-ray spectrometer Fig. 6 Schematic of a complete energy-dispersive x-ray spectrometer used in electron-probe x-ray microanalysis. Various pulse processing functions and the multichannel analyzer are shown. FET, field effect transistor Fig. 7 (a) SEM image and (b) EDS spectrum...
Series: ASM Failure Analysis Case Histories
Volume: 1
Publisher: ASM International
Published: 01 December 1992
DOI: 10.31399/asm.fach.v01.c9001109
EISBN: 978-1-62708-214-3
... years to approximately 9 months. Several corroded grate bars were examined metallographically and by electron microscopy to determine the causes of the accelerated corrosion. Chemical and X-ray diffraction analyses were also conducted, along with simulation tests to assess the role of alkali chlorides...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006786
EISBN: 978-1-62708-295-2
... on the facets. The presence of this layer can be detected by energy-dispersive x-ray spectroscopy (EDS), with decreasing intensity nearer to the final fracture area. Long counting times and/or low electron accelerating voltages may be needed, because the embrittler layer can be much thinner than the penetration...
Series: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001339
EISBN: 978-1-62708-215-0
... on welding backup rings from are strikes. These tungsten-rich areas had the same high-density characteristics as mercury on the x-ray film and were first misinterpreted as mercury contamination. When mercury was suspected as having been detected by radiography, these pipe weld areas were heated with a gas...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001831
EISBN: 978-1-62708-241-9
... used to analyze the microscopic morphologies along with the micro-area compositions of the fracture surface and the contact surface of the bearing’s outer ring. Furthermore, Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy (RS), thermogravimetric analysis (TGA), and x-ray diffraction...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001775
EISBN: 978-1-62708-241-9
..., energy dispersive x-ray analysis (EDXA) indicated significant segregation of sulfur and chlorine along the grain boundaries. Failure was attributed to hypochlorous-acid (HClO)-induced stress-corrosion cracking (SCC). The HClO was formed by the reaction of HCl with atmospheric O 2 that entered the tube...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003554
EISBN: 978-1-62708-180-1
.... These temperature excursions also caused stress and strain in the piping, which cracked the passive layer, allowed the mercury to wet the weld metal at the root of the weld, and led to LMIE crack propagation. Other mercury-contaminated welds were detected by x-ray radiography and removed, and the mercury absorption...