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Scanning electron microscopy
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Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... preparation scanning electron microscope scanning electron microscopy THE SCANNING ELECTRON MICROSCOPE (SEM) is one of the most versatile instruments for investigating the microscopic features of most solid materials. Compared to the light microscope, it expands the resolution range by more than 1...
Abstract
The scanning electron microscope (SEM) is one of the most versatile instruments for investigating the microscopic features of most solid materials. The SEM provides the user with an unparalleled ability to observe and quantify the surface of a sample. This article discusses the development of SEM technology and operating principles of basic systems of SEM. The basic systems covered include the electron optical column, signal detection and display equipment, and the vacuum system. The processes involved in the preparation of samples for observation using an SEM are described, and the application of SEM in fractography is discussed. The article covers the failure mechanisms of ductile failure, brittle failure, mixed-mode failure, and fatigue failure. Lastly, image dependence on microscope type and operating parameters is also discussed.
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... Abstract The scanning electron microscopy (SEM) is one of the most versatile instruments for investigating the microstructure of metallic materials. This article highlights the development of SEM technology and describes the operation of basic systems in an SEM, including the electron optical...
Abstract
The scanning electron microscopy (SEM) is one of the most versatile instruments for investigating the microstructure of metallic materials. This article highlights the development of SEM technology and describes the operation of basic systems in an SEM, including the electron optical column, signal detection and display equipment, and vacuum system. It discusses the preparation of samples for observation using an SEM and describes the application of SEM in fractography. If the surface remains unaffected and undamaged by events subsequent to the actual failure, it is often a simple matter to determine the failure mode by the use of an SEM. In cases where the surface is altered after the initial failure, the case may not be so straightforward. The article presents typical examples that illustrate these points. Image dependence on the microscope type and operating parameters is also discussed.
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in Metallurgical Investigation of a Prematurely Failed Roller Bearing Used in the Support and Tilting System of a Steel Making Converter Used in an Integrated Steel Plant
> ASM Failure Analysis Case Histories: Steelmaking and Thermal Processing Equipment
Published: 01 June 2019
Fig. 7 Scanning electron microscopy (SEM) photographs showing the fracture surface of the failed converter bearing sample. (a) Fracture region showing striations and dimples on either side of crack, 1000×; (b) Angular inclusion particle (at the cross intersection) inside the crack
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in Microstructural Analysis of Failure of a Stainless Steel Bone Plate Implant
> ASM Failure Analysis Case Histories: Medical and Biomedical Devices
Published: 01 June 2019
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in Microstructural Analysis of Failure of a Stainless Steel Bone Plate Implant
> ASM Failure Analysis Case Histories: Medical and Biomedical Devices
Published: 01 June 2019
Fig. 4 Scanning electron microscopy micrographs of surface fracture A with identification of fracture initiation site
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in Mobile Harbor Crane Wheel Hub Fatigue Failure
> ASM Failure Analysis Case Histories: Construction, Mining, and Agricultural Equipment
Published: 01 June 2019
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Published: 01 January 2002
Fig. 1 Scanning electron microscopy photo of the surface of a 300-series stainless steel sample obtained from AES instrument. Field of view, 1 μm
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Published: 30 August 2021
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Published: 30 August 2021
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Published: 30 August 2021
Fig. 29 Scanning electron microscopy image of fracture surface showing the presence of intergranular fracture and crack branching, both common characteristics of high-pH SCC
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Published: 30 August 2021
Fig. 32 Optical and scanning electron microscopy images of origin location of near-neutral-pH SCC showing multiple dark thumbnail-shaped cracks extending from the outer diameter (OD) and coalescing, and a small region of ductile overload between the crack and inner diameter (ID)
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Published: 30 August 2021
Fig. 35 Scanning electron microscopy image of intergranular fracture-surface morphology within the origin region
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in Failures of Pressure Vessels and Process Piping
> Analysis and Prevention of Component and Equipment Failures
Published: 30 August 2021
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in Failures of Pressure Vessels and Process Piping
> Analysis and Prevention of Component and Equipment Failures
Published: 30 August 2021
Fig. 52 Backscattered scanning electron microscopy images of (a) 2% ferrite, annealed and air cooled, showing carbide and chi (light) phase (28Cr-53Fe-12Mo-5Ni) with 0.10 mm (0.004 in.) lateral expansion at −195 °C (−320 °F), and (b) 2% ferrite, annealed and air cooled, showing virtually
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in Failure of Boilers and Related Equipment
> Analysis and Prevention of Component and Equipment Failures
Published: 30 August 2021
Fig. 31 Scanning electron microscopy after metallography on failed sample revealed scattered grain-boundary fissures and intergranular cracks. Original magnification: 1000×
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in Failure of Boilers and Related Equipment
> Analysis and Prevention of Component and Equipment Failures
Published: 30 August 2021
Fig. 47 Scanning electron microscopy image showing the cleavage-type brittle crack surface . Original magnification: 1000×
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in Failure of Boilers and Related Equipment
> Analysis and Prevention of Component and Equipment Failures
Published: 30 August 2021
Fig. 64 Scanning electron microscopy images of failed tube. (a) Outer surface near puncture showing erosion marks having directionality pattern. Original magnification: 100× (b) Embedded fly-ash particles. Original magnification: 3000×
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in Failure Analysis of Medical Devices
> Analysis and Prevention of Component and Equipment Failures
Published: 30 August 2021
Fig. 5 Scanning electron microscopy image of outer surface of the stem at fatigue crack initiation location. Arrows indicate fretting and iatrogenic damage from contact with the proximal body.
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in Failure Analysis of Medical Devices
> Analysis and Prevention of Component and Equipment Failures
Published: 30 August 2021
Fig. 6 Scanning electron microscopy image showing microvoid coalescence in a fractured nitinol wire
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in Failure Analysis of Medical Devices
> Analysis and Prevention of Component and Equipment Failures
Published: 30 August 2021
Fig. 7 Scanning electron microscopy image showing dimplelike pitting corrosion reminiscent of microvoid coalescence morphology
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