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Electron probe analysis

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Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.homegoods.c0049838
EISBN: 978-1-62708-222-8
... interfaces. These intermetallics were established to have a high resistance causing significant resistive heating. Electrical circuits Electron probe analysis Wire connections Aluminum wire (Other, miscellaneous, or unspecified) failure The electron probe microanalyzer has been applied...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
... and Examination of Metallographic Specimens in Failure Analysis Evaluation of Polymers in Failure Analysis Secondary Ion Mass Spectroscopy Auger Electron Spectroscopy Electron Probe Microanalysis Energy-Dispersive X-Ray Analysis X-Ray Powder Diffraction Cutting Mounting Mechanical...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.steel.c9001535
EISBN: 978-1-62708-232-7
... Limited. Microstructural issues influencing roll quality, such as characteristics of carbides, tempered martensite, retained austenite, etc., have been extensively studied through optical and scanning electron microscopy, electron-probe microanalysis, image analysis, and x-ray diffractometry...
Series: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001391
EISBN: 978-1-62708-215-0
... process were selected for analysis, along with additional samples representing the various resistor failures. Visual examination revealed two different types of termination failures: total delamination and partial delamination. Electron probe microanalysis confirmed that the fracture occurred at the end...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.steel.c9001532
EISBN: 978-1-62708-232-7
..., quantitative image analysis (QIA), and electron-probe microanalysis (EPMA). These are discussed in the context of spalling propensity and roll life. In the finishing trains of hot-strip mills (HSMs), work rolls made of indefinite chill double-poured (ICDP) iron are commonly used owing to their resistance...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.auto.c0046981
EISBN: 978-1-62708-218-1
... of the valve. Analysis (visual inspection, electron probe x-ray microanalysis, hardness testing, 4.5x fractograph) supported the conclusions that failure of the valve stem occurred by fatigue as a result of a combination of a nonuniform bending load, which caused a mild stress-concentration condition...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.modes.c0046371
EISBN: 978-1-62708-234-1
... contained any stainless steel from the spacer. Other items for investigation were the nature of the bond between the galled spot and the inner cone and any evidence of overtempering or rehardening resulting from localized overheating. Analysis (visual inspection, electron probe x-ray microanalysis...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... by a strong condenser lens (i.e. high resolution or low probe current) and a short working distance. A wide range of signals is available for collection in any SEM. The most common signals used are the secondary and primary backscattered electron signals (SE, BSE) for imaging and the characteristic x-ray...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... working distance. A wide range of signals is available for collection in any SEM. The most common signals used are the secondary electron and primary backscattered electron signals for imaging, and the characteristic x-ray signal emitted from the sample for composition identification. If the probe...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001778
EISBN: 978-1-62708-241-9
...× Microanalysis of the Entrapments Electron probe microanalysis of the longitudinal sections of all the four failed wire samples containing cracks were carried out. EPMA analysis of the crack at various points indicated absence of any notable entrapment within the cracks in all the samples. Typical secondary...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.steel.c9001645
EISBN: 978-1-62708-232-7
...) analysis of inclusion observed at the crack site on the fracture surface of the failed converter bearing sample, showing Ca, Al, and Si X-ray peaks indicating the presence of silicate inclusion Electron probe microanalysis (EPMA) was carried out across the cross section of the failed bearing...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
...Surface analysis technique summary chart Table 1 Surface analysis technique summary chart Surface analysis technique Parameter AES XPS TOF-SIMS Probe beam Electrons X-ray photons Ions Analyzed beam Electrons Electrons Ions Average sampling depth 5 nm 5...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
...Summary chart of techniques discussed in this article Table 2 Summary chart of techniques discussed in this article Feature Technique AES XPS TOF-SIMS Probe beam Electrons X-ray photons Ions Analyzed beam Electrons Electrons Ions Average sampling depth 5 nm 5 nm...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003556
EISBN: 978-1-62708-180-1
... of organic nutrients to carbon dioxide. Under anaerobic conditions, electron acceptors other than oxygen can be used. Figure 1 illustrates the range of pH and redox potential where anaerobic forms of microbial metabolism tend to be found ( Ref 18 ). Fig. 1 The pH and oxidation reduction potential...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.modes.c0046991
EISBN: 978-1-62708-234-1
..., which resulted from heating during welding. Electron probe x-ray microanalysis showed the outside surface of the tube did not have the protective chromium oxide scale normally found on Incoloy 800. The inside surface of the tube had a thin chromium oxide protective scale. This evidence supported...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.petrol.c9001247
EISBN: 978-1-62708-228-0
..., passed at 1150 psig. The sour gas was heated to 600 deg F by burners playing on the outside of the tube burning “sweet” gas plus air. The inner and outer surfaces of all samples showed evidence of corrosive attack. Electron probe microanalysis showed the corrosion products contained sulfur with iron...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006757
EISBN: 978-1-62708-295-2
... Energy-Dispersive X-Ray Analysis Electron Probe Microanalysis Auger Electron Spectroscopy Secondary Ion Mass Spectroscopy X-Ray Powder Diffraction Cutting Mounting Mechanical Preparation (Grinding and Polishing) Ceramographic Etching Hardness Determination by Microindentation...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... spectrometer used in electron-probe x-ray microanalysis. Various pulse processing functions and the multichannel analyzer are shown. FET, field effect transistor Fig. 9 SEM image showing carbon residue buildup from the electron beam scan area in the SEM Abstract Abstract This article...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006764
EISBN: 978-1-62708-295-2
... Testing , 1985 31. Halmshaw R. , Nondestructive Testing , Edward Arnold Publishers , 1987 32. Bossi R.H. and Kruse R.J. , “ X-Ray Tomographic Inspection of Printed Wiring Assemblies and Electrical Components ,” Boeing Aerospace and Electronics Co. , Seattle, WA , 1990...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001773
EISBN: 978-1-62708-241-9
... The exposed fracture surface shown in Fig. 9 was examined using scanning electron microscopy (SEM) and energy dispersive microscopy (EDS). The surface proved to be covered with corrosion product with the result that electron micrographs taken using SEM were nondescript and are, hence, not included...