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Digital image analysis

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Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.aero.c9001144
EISBN: 978-1-62708-217-4
... the aircraft was landed. The helicopter main rotor blade spar fracture was analyzed by conventional and advanced computerized fractographic techniques. Digital fractographic Imaging Analysis of theoretical and actual fracture surfaces was applied for automatic detection of fatigue striation spacing...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006763
EISBN: 978-1-62708-295-2
... analysis process, including a liquid crystal diode display screen for display of the image, removable storage media, and interchangeable lenses, including prime lenses, zoom lenses, and macro and micro lenses. The professional digital camera has the added advantage of immediate on-camera viewing...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006851
EISBN: 978-1-62708-395-9
... digital camera. It covers basic photographic principles and manipulation of settings that assist in producing high-quality images. The need for accurate photographic documentation in failure analysis is also presented. failure analysis photographic documentation photography professional digital...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003527
EISBN: 978-1-62708-180-1
... on the camera imaging screen or on a computer screen. Inadequacies in illumination or exposure can be quickly detected and corrected. It is especially useful in documenting stages of a failure analysis where cleaning or sectioning is involved. Each step of the process can be documented with digital photography...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003536
EISBN: 978-1-62708-180-1
.... Development of the scanning electron microscope (SEM), and more recently, of powerful digital image analysis equipment, has led to significant advances in quantitative fractography. Numerous quantitative correlations between the material properties such as strength, ductility, toughness, and fatigue life...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006764
EISBN: 978-1-62708-295-2
... temperatures are imaged by point sensors, IR cameras, or coatings that change appearance with temperature. Analysis is based on absolute and change of temperature following a stimulus. Locating near-surface discontinuities that alter heat transfer through object Requires precise control of environment, heat...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006936
EISBN: 978-1-62708-395-9
.... The digitized waveform features of interest within a given gate are mapped into image values; these form a 2D C-scan for each gated region. This form of imaging allows the user to interrogate the complete waveform database easily to generate C-scans from any number of features or gating schemes. Modern...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006758
EISBN: 978-1-62708-295-2
... film techniques and are becoming widely available for specific failure analysis applications. Backscatter x-ray imaging, computed radiography, digital radiography, and computed tomography (CT) are available to investigate the volume of the component where traditional RT and UT techniques may...
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006801
EISBN: 978-1-62708-329-4
.... Locations measuring greater than TLC 0 but having positive minor strains may still be lower than the forming limit as a result of the FLC shape to the right of FLC 0 . This is one of the merits of using grid strain analysis rather than thinning strain analysis. Digital Image Correlation Digital...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006945
EISBN: 978-1-62708-395-9
... for assembly design for manufacturing and assembly diglycidyl ether of bisphenol A digital image correlation dynamic key curve dynamic mechanical analysis degree of freedom dioctyl phthalate differential scanning calorimetry differential thermal analysis de ection temperature under load drop weight index poly...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006772
EISBN: 978-1-62708-295-2
... Abstract Failure analysis is generally defined as the investigation and analysis of parts or structures that have failed or appeared to have failed to perform their intended duty. Methods of field inspection and initial examination are also critical factors for both reconstruction analysts...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.aero.c9001605
EISBN: 978-1-62708-217-4
... at the tips of the cracks were evaluated using electron micrograph stereo image pairs to characterize local fracture toughness. To complete the failure analysis, nondestructive evaluation, metallographic examination, and chemical investigations were carried out. No secondary cracks could be found. Most...
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006837
EISBN: 978-1-62708-329-4
... of the image. Some decarburization is present along the forging surface Fig. 61 Opposite side of plate to initiation. More decarburization is present along the forging surface Chemical composition analysis was performed using an ARL optical emission spectrometer. Table 1 contains the results...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
..., an SEM can be designed to enhance particular capabilities. For example, proper choice of the electron source can be used to enhance imaging, while changing the types of x-ray detectors can provide better chemical analysis. Modifying the vacuum system can allow examination of a wide range of sample types...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
..., molecular Strengths Ultimate small area analysis, imaging Ease of use, quantification Chemical and molecular analysis, imaging Limitations Semiconductive Very few Quantification difficult Major applications Semiconductors, electronics All industries Polymers, contamination, trace metal...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006942
EISBN: 978-1-62708-395-9
... angles to create a 3D digital image of the product. CT scanning has the power to resolve features from as small as a few microns to a meter (3.3 ft.) in size, and the 3D data gathered from the exam can be coupled with advanced software analysis to perform measurements and “slice” the data...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... interests of the user. Scanning electron microscopes have been found particularly useful in failure analysis investigations. This is true for a number of reasons, the most prominent being the ability of the SEM to image large, nonflat samples from low to high magnifications (approximately 10× to greater...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006943
EISBN: 978-1-62708-395-9
... analysis ( Ref 3 ).(Note: AES combined with EDS or SIMS can be used for trace impurity analysis.) There is an Auger instrument capable of imaging using SEs, just as an SEM, and it is referred to as a scanning Auger microscope. This tool can be used for image analysis of nanoscale structures ( Ref 3 , 9...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006865
EISBN: 978-1-62708-395-9
... microscopes that include digital cameras and a motorized stage that allow for “extended focus” or greater depth of field. The microscope takes several digital photographs at different focus points. The images are then merged into one photograph that is entirely in focus. This may be called a z-stack...
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006838
EISBN: 978-1-62708-329-4
... and fabrication sources of failure, addresses the key factors in production and quality control, and explains failure analysis of AM parts. binder jet sintering directed energy deposition failure analysis metal products metallurgical characteristics powder bed fusion quality assurance ADDITIVE...