1-20 of 28 Search Results for

waveform acquisition

Sort by
Journal Articles
EDFA Technical Articles (2000) 2 (3): 20–25.
Published: 01 August 2000
...Wai Mun Yee; Mario Paniccia; Travis Eiles; Valluri Rao Laser voltage probing (LVP), an IR-based technique, facilitates through-silicon signal waveform acquisition and high frequency timing measurements from active p-n junctions on CMOS ICs. The ICs can be in flip-chip as well as wire-bond packages...
Journal Articles
EDFA Technical Articles (2001) 3 (1): 35–35C.
Published: 01 February 2001
... circuits from the backside through the bulk silicon. In this article, the authors explain how they used the new system to gain access to signal lines for backside waveform acquisition. They also describe some of the procedures they developed to repair and modify flip chip circuits from the backside...
Journal Articles
EDFA Technical Articles (2003) 5 (4): 13–24.
Published: 01 November 2003
...), and laser-based fault isolation methods with emphasis on light-induced voltage alteration (LIVA). It explains how laser voltage probing is used for backside waveform acquisition and describes backside sample preparation and deprocessing techniques including parallel polishing and milling, laser chemical...
Journal Articles
EDFA Technical Articles (2004) 6 (2): 28–30.
Published: 01 May 2004
...; Localization and electrical characterization in the metal stack; Techniques for artifact-free deprocessing; Focused ion beam (FIB) for new technologies, particularly the new materials; Vertical resolution in imaging; Waveform acquisition technology extension; and Fault isolation and simulation...
Journal Articles
EDFA Technical Articles (2001) 3 (3): 15–18.
Published: 01 August 2001
.... Copyright © ASM International® 2001 2001 ASM International logic level mapping SEM imaging timing waveform acquisition voltage contrast Voltage Contrast httpsdoi.org/10.31399/asm.edfa.2001-3.p015 Theory of SEM Voltage Contrast and Applications to IC Failure Analysis Valluri Rao Intel Corp...
Journal Articles
EDFA Technical Articles (2015) 17 (2): 10–17.
Published: 01 May 2015
... LVP or microprobing waveform acquisition. EXAMPLE: PICOSECOND TR-LADA ENABLES LVP Figure 3 shows the workflow of an analysis of a shmoo stripe issue. LADA analysis revealed sites leading to a clock mux. Waveforms were necessary to understand the nature of the failure, because the issue did not appear...
Journal Articles
EDFA Technical Articles (2024) 26 (2): 32–38.
Published: 01 May 2024
... alignment appears to be perfect, small changes in overall system drift can result in waveforms collected from a single target appear to be significantly different over multiple acquisition attempts. Therefore, as technology shrinks it can be increasingly difficult to successfully acquire pass versus fail...
Journal Articles
EDFA Technical Articles (2007) 9 (4): 6–13.
Published: 01 November 2007
... by Beam-Based Technology, Microelectronics Failure Analysis Desk Reference, 4th ed., ASM International, 1999, pp. 149-59. 15. H. Wang, H. Koike, M. Ikeda, and K. Kanai: Open Loop Method for Waveform Acquisition on Electron-Beam Probe Systems, Adv. Microelectron. Device Technol., SPIE 4600, 2001, p. 154...
Journal Articles
EDFA Technical Articles (2023) 25 (4): 28–34.
Published: 01 November 2023
.... A continuous electron beam of 100 pA was directed at the sample, and an oscilloscope averaged one million samples taken directly from the detector. Such waveform captures require acquisition times on the order of a second. Probing with continuous DC electron beams is very useful for observing DUT frequencies...
Journal Articles
EDFA Technical Articles (2020) 22 (2): 29–35.
Published: 01 May 2020
... stimulation and the reception of the corresponding thermal response that is measured at the device's surface.[4-5] This delay is normalized to the analysis frequency and expressed in terms of a phase shift. The classical lock-in approach repeats the data acquisition at multiple frequencies to obtain a phase...
Journal Articles
EDFA Technical Articles (2016) 18 (4): 16–22.
Published: 01 November 2016
... and design-for-test features, the use of noninvasive optical techniques for probing waveforms from internal nodes of integrated circuits (ICs) remains very important for the fast and accurate localization of failures. Currently, laser voltage probing (LVP)[1] is the most commonly used time-resolved technique...
Journal Articles
EDFA Technical Articles (2015) 17 (4): 32–36.
Published: 01 November 2015
..., such as dead opens, resistive opens, and short-circuit defects. Reflections are recorded as a function of time and result in the EOTPR waveform. The EOTPR generates an impulse response rather than the step response of conventional TDR. Therefore, for EOTPR, high impedance discontinuities in a DUT result...
Journal Articles
EDFA Technical Articles (2015) 17 (1): 33–37.
Published: 01 February 2015
...-induced voltage alteration, or optical beam-induced resistance change. The final example was to extract hundreds of thousands of waveforms from a device automatically, which can then be used to reveal connections between logic cells and functional blocks. Can we trust our hardware? An example is a Trojan...
Journal Articles
EDFA Technical Articles (1999) 1 (3): 6–17.
Published: 01 August 1999
... waveforms measured from the diffusion nodes of an operating CMOS microprocessor showing passing and failing waveforms. fast with bandwidths well into the tHz frequencies. The price one pays for stroboscopic acquisition is that measurements can only be made while the chip is executing repetitive test loops...
Journal Articles
EDFA Technical Articles (2006) 8 (2): 22–27.
Published: 01 May 2006
... with either a falling or rising signal edge. By imaging the area of failing circuitry and then electrically stimulating the device through its failing state, the waveforms that are present on the internal nodes of the failing circuit block can be deduced. The challenge in physical analysis then becomes a task...
Journal Articles
EDFA Technical Articles (2021) 23 (3): 24–31.
Published: 01 August 2021
... (also sometimes referred as post-acquisition processing) has also been explored by researchers to further extend capabilities of the technique. For instance, F. Lan et al.[8] reported the use of deconvolution algorithms to recover better resolved images. Another approach presented by I. Vogt et al.[9...
Journal Articles
EDFA Technical Articles (2018) 20 (2): 18–24.
Published: 01 May 2018
... because the data propagation through the scan chain is clocked with a periodic signal. The LVI map can easily identify the broken point for a scan chain failure, whether the defect is in the data signal path or in the clock signal path. LVP enables acquisition of a waveform in the time domain...
Journal Articles
EDFA Technical Articles (2009) 11 (2): 6–14.
Published: 01 May 2009
...) Comparing this to Fig. 4, at the beginning of the pTA window, the synchronous measurement is beneficial; however, at the end of the pTA window, the asynchronous setup provides a better SNR for the same acquisition time. Experimental To demonstrate the characteristics of the asynchronous setup as opposed...
Journal Articles
EDFA Technical Articles (2013) 15 (3): 4–11.
Published: 01 August 2013
... of failures with the required fast cycle time. Complex failures that are not resolved by the faster global approaches are best addressed by probing technologies, where waveforms or voltages are measured from node to node. These approaches are time-consuming and usually require detailed understanding...
Journal Articles
EDFA Technical Articles (2018) 20 (1): 10–18.
Published: 01 February 2018
... to SDL in (b). A PMOS gated by the clock is highlighted in a flip-flop. edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 20 NO. 1 12 The LVP technique[3] integrates voltage waveforms acquired on each transistor of the flip-flop. It requires a looping test sequence with all the measured signals...