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systematic yield loss

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Journal Articles
EDFA Technical Articles (2018) 20 (3): 4–7.
Published: 01 August 2018
... circuit complexity, systematic and random defects, and defect clustering. As the examples in the article show, with just a basic understanding of yield models, readers can estimate expected yield losses and identify abnormal yield results for a given design. Copyright © ASM International® 2018 2018...
Journal Articles
EDFA Technical Articles (2019) 21 (1): 4–9.
Published: 01 February 2019
..., complementary FET, and others. This implies that more defects and systematic yield issues are expected in the front-end layers that are inside library cells. We can expect an increase in the number of defects only caught at the end-of-line during final test of manufactured die. This will occur despite all...
Journal Articles
EDFA Technical Articles (2014) 16 (3): 4–12.
Published: 01 August 2014
... circuits against expected responses after structural testing to predict failure suspects.[3] In addition to confidence score and suspected fail path length, a second step, known as volume statistical analysis, searches for systematics and assesses the potential yield impact for FA prioritization. Some...
Journal Articles
EDFA Technical Articles (2013) 15 (1): 35–36.
Published: 01 February 2013
... a multitude of details. IC circuitry and electrical failure isolation steps were necessarily bypassed. Physical analysis alone detected and isolated the process step that was causing yield loss. Summary Three papers in the Case Histories I session were discussed from the viewpoint of problem solving. However...
Journal Articles
EDFA Technical Articles (2007) 9 (3): 6–16.
Published: 01 August 2007
... processes and even indicate which metal layer and specific design feature is at fault in many cases. Design Changes for Improved Yield With each process node below 130 nm, design features are responsible for an increasing amount of yield loss. During the design process, great care is taken to ensure...
Journal Articles
EDFA Technical Articles (2012) 14 (3): 4–11.
Published: 01 August 2012
... 7 3-D SiP (continued from page 7) identified during the product life cycle, the bigger its negative impact on a company s business. Quality problems that result in field returns mean loss of yield, loss of positive image, maybe the loss of repeat business or the customer, and thus a tremendous...
Journal Articles
EDFA Technical Articles (2004) 6 (1): 13–21.
Published: 01 February 2004
... useful in this charactoo high can cause state loss. Briefly, state loss occurs terization but is limited by the difficulty of achieving when the off or total leakage current of the tran- complete coverage. As mentioned earlier, precharged sistors holding a state node exceeds that of the on (domino...
Journal Articles
EDFA Technical Articles (2010) 12 (2): 12–18.
Published: 01 May 2010
... layer information as well, such as via type or cell type. Evaluating this information from a large number of dies in a statistical analysis process derives information on possible commonalities, that is, a systematic yield problem. In this sense, the layoutaware defect-bounding boxes are a cornerstone...
Journal Articles
EDFA Technical Articles (2014) 16 (4): 4–12.
Published: 01 November 2014
... yield loss. Identifying cause is the only goal. Unlike FA, device history and associated process data are always available and fully utilized. References 1. P. Jacobs: EOS (Electrical Overstress) The Old, Unknown Phenomena? Int. Symp. Test. Fail. Anal. (ISTFA), 2012, pp. 156-63. 2. M. Gores: Mis...