Skip Nav Destination
Close Modal
Search Results for
parametric DLS
Update search
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
NARROW
Format
Journal
Article Type
Date
Availability
1-1 of 1
Search Results for parametric DLS
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Journal Articles
Parametric Dynamic Laser Stimulation
Available to Purchase
EDFA Technical Articles (2010) 12 (4): 22–27.
Published: 01 November 2010
...Kevin Sanchez Dynamic laser stimulation is widely used in the PASS/FAIL mapping mode for soft defect localization. Recent improvements, including parametric mapping and multiple-parameter acquisition, significantly increase the amount of information that can be extracted from DLS measurements...
Abstract
View articletitled, <span class="search-highlight">Parametric</span> Dynamic Laser Stimulation
View
PDF
for article titled, <span class="search-highlight">Parametric</span> Dynamic Laser Stimulation
Dynamic laser stimulation is widely used in the PASS/FAIL mapping mode for soft defect localization. Recent improvements, including parametric mapping and multiple-parameter acquisition, significantly increase the amount of information that can be extracted from DLS measurements. This article explains where and how these new techniques are used and how they may be even further improved.
