1-20 of 227 Search Results for

optical techniques

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles
EDFA Technical Articles (2001) 3 (4): 29–35.
Published: 01 November 2001
...J.M. Chin; M. Palaniappan; J.C.H. Phang; D.S.H. Chan; G. Gilfeather Single contact optical beam induced currents (SCOBIC) is a variation on the OBIC failure analysis technique that requires only one point of contact with the junction being examined. This article discusses the basic principles...
Journal Articles
EDFA Technical Articles (2010) 12 (2): 20–28.
Published: 01 May 2010
... This article summarizes major discussion points from four User’s Group meetings held at the ISTFA 2009 conference. The topics addressed are "Optical Techniques: Growth and Limitations," "Resolution of Nanoprobing for 45 nm and Beyond: New Challenges," "FIB," and "Fast ASIC Fault Isolation...
Journal Articles
EDFA Technical Articles (2010) 12 (3): 20–27.
Published: 01 August 2010
...S.H. Goh; A.C.T. Quah; J.C.H. Phang; V.K. Ravikumar; S.L. Phoa; V. Narang; J.M. Chin; C.M. Chua The best spatial resolution that can be achieved with far-field optical fault localization techniques is around 20 times larger than the critical defect size at the 45 nm technology node. There is also...
Journal Articles
EDFA Technical Articles (2008) 10 (2): 12–18.
Published: 01 May 2008
... SOM techniques, and discusses emerging applications. Copyright © ASM International® 2008 2008 ASM International laser signal injection microscopy photocarrier injection scanning optical microscopes thermal injection httpsdoi.org/10.31399/asm.edfa.2008-2.p012 EDFAAO (2008) 2:12-18...
Journal Articles
EDFA Technical Articles (2010) 12 (3): 44–47.
Published: 01 August 2010
... circuit or through shifting bias levels via different types of defects. carrier injection. These dynamic LSIM techniques And then there was light (pun intended). Electrical engineers needed to become optics experts overnight. Antireflection coatings were rediscovered as a tool to remove the unwanted glare...
Journal Articles
EDFA Technical Articles (2016) 18 (4): 16–22.
Published: 01 November 2016
... and design-for-test features, the use of noninvasive optical techniques for probing waveforms from internal nodes of integrated circuits (ICs) remains very important for the fast and accurate localization of failures. Currently, laser voltage probing (LVP)[1] is the most commonly used time-resolved technique...
Journal Articles
EDFA Technical Articles (2009) 11 (2): 46–48.
Published: 01 May 2009
... such as through-silicon vias created big issues: Heterogeneous systems with sensors, power, logic, analog, and wireless Vertical integration with no transparent layer, where optical techniques cannot be applied Simultaneously, more Moore trends are still alive, Volume 11, No. 2 47 Guest Columnist...
Journal Articles
EDFA Technical Articles (2022) 24 (1): 29–32.
Published: 01 February 2022
..., an order of magnitude better as compared to standard numbers obtained in all-optical techniques such as EMMI and OBIRCH. In addition, the information obtained is quantitative, the operator thus knows how much current is flowing through the defect. Beyond that, the scanning NV technique allows to sense...
Journal Articles
EDFA Technical Articles (2001) 3 (1): 4–9.
Published: 01 February 2001
..., impurity, and composition analysis supports this idea17. FIB Near-field techniques are at the frontier of new optical sample preparation aligns with all of the drivers, and microscope development where efforts are focused on these tools are making strong inroads into a broad techniques for inspecting small...
Journal Articles
EDFA Technical Articles (2010) 12 (3): 4–8.
Published: 01 August 2010
... optical techniques, including the IVAs, have benefited from the ongoing developments in optical spatial resolution. A major strength in optical approaches is the relative transparency that silicon has to infrared light, which allows for backside analysis. The typical wavelengths used, on the order of 1.0...
Journal Articles
EDFA Technical Articles (2020) 22 (4): 28–33.
Published: 01 November 2020
... energy can be tuned to control its penetration depth into the material, enabling depth-sensitive measurements and subsurface defect localization the focusing capability of electrons allows for resolutions in the nanometer range, much better than any other optical technique it is inherently...
Journal Articles
EDFA Technical Articles (2021) 23 (2): 4–12.
Published: 01 May 2021
... and techniques, and provides insights on effective countermeasures. The inverted orientation of a flip-chip packaged die makes it vulnerable to optical attacks from the backside. This article discusses the nature of that vulnerability, assesses the threats posed by optical inspection tools and techniques...
Journal Articles
EDFA Technical Articles (2019) 21 (3): 16–24.
Published: 01 August 2019
... and assess the root of trust. Physical inspection methods such as reverse engineering, electrical and optical probing, photonic emission analysis, fault injection techniques, and side-channel analysis have been developed to support chip failure analysis (FA) at the post-silicon stage. Access to the physical...
Journal Articles
EDFA Technical Articles (2016) 18 (4): 24–29.
Published: 01 November 2016
... daisy chain.[2] OPTICAL TECHNIQUES The traditional light-based techniques can also be applied, if the light can access the region of interest in or out of a 3-D stack. A lesser-known technique, polariscopy,[5] was demonstrated to be very sensitive to local mechanical shear stress variations, as also...
Journal Articles
EDFA Technical Articles (2015) 17 (1): 12–20.
Published: 01 February 2015
...: METROLOGY CHIP AND EXAMPLE William Lo and Howard Marks, NVIDIA wilo@nvidia.com INTRODUCTION Backside optical techniques such as emission microscopy (EMMI), laser voltage probing and its extensions (LVx), and dynamic laser stimulation are mainstays of failure analysis (FA1-4] Solid immersion lenses (SILs...
Journal Articles
EDFA Technical Articles (2021) 23 (3): 24–31.
Published: 01 August 2021
... of Burgundy, France. His research interests focus on the use and enhancement of signals acquired from optical techniques for IC analysis. Chung Tah Chua holds a Ph.D. from the school of materials science and engineering of Nanyang Technological University, Singapore, and is currently a research scientist...
Journal Articles
EDFA Technical Articles (2000) 2 (2): 32–32B.
Published: 01 May 2000
...R. Aaron Falk The transition to “flip-chip” packaging forced a renaissance in failure analysis methods, usually referred to as backside failure analysis. This article describes one such technique based on active laser probing. The technique uses the optical properties of the silicon substrate...
Journal Articles
EDFA Technical Articles (2014) 16 (2): 26–32.
Published: 01 May 2014
... they optimize lateral and longitudinal resolution of IR-based methods using aplanatic solid immersion lenses in combination with adaptive optics that correct for aberrations, interferometry to improve signal-to-noise ratios, vortex beams that overcome diffraction limitations, and image reconstruction techniques...
Journal Articles
EDFA Technical Articles (2003) 5 (4): 27–32.
Published: 01 November 2003
... techniques must be able to scrutinize the optical properties of the sample to determine the cause of degradation or failure. The popular techniques for this type of analysis are photoluminescence, cathodoluminescence, and electroluminescence. Each technique must produce light in the sample (via different...
Journal Articles
EDFA Technical Articles (1999) 1 (3): 6–17.
Published: 01 August 1999
... many new techniques emerged so quickly. Analysts are challenged to learn, to adapt, and to implement changes to remain productive as IC technology continues its exponential growth. Physical principles relatively new to FA like time-correlated photon counting, electro-optical probing, anti-reflective...