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logic mapping

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Journal Articles
EDFA Technical Articles (2001) 3 (4): 3–11.
Published: 01 November 2001
... database and pattern sets, the extraction can be automated and the analysis completed within minutes. The logic mapping flow is a natural extension of scan-based diagnosis with the potential to reach new levels of electrical failure analysis without the extensive data collection and resources associated...
Journal Articles
EDFA Technical Articles (2003) 5 (4): 13–24.
Published: 01 November 2003
... transistor logic states (logic mapping); however, logicstate LIVA signals are much weaker than defectgenerated LIVA signals. Speaking of sensitivity, IC defects will produce LIVA signals 3 to 4 orders of magnitude greater than LIVA signals produced during the logic mapping of nondefective ICs (see subsequent...
Journal Articles
EDFA Technical Articles (2001) 3 (3): 15–18.
Published: 01 August 2001
... about the functionality of ICs. Voltage contrast can be used, for example, to map electrical logic levels and timing waveforms from internal nodes of the chip as it operates inside the SEM chamber. This article describes the fundamentals of voltage contrast and its applications in IC failure analysis...
Journal Articles
EDFA Technical Articles (2006) 8 (2): 22–27.
Published: 01 May 2006
... node names are converted to physical X-Y coordinates through the use of a variety of cross-mapping techniques. With logical-to-physical cross-mapping in place, it is possible to drive the prober stage to the correct X-Y This article is based on material presented at DAC 2004, San Diego, Calif...
Journal Articles
EDFA Technical Articles (2015) 17 (1): 33–37.
Published: 01 February 2015
... consisted of extended wavelength emission detection, laser logic-state imaging, SIGNALS WITH THINNED picosecond time-resolved laser-assisted device alteration (LADA), spectral mapping through transmission grating, SILICON. and many more. The physical improvements consisted of work with aplanatic solid...
Journal Articles
EDFA Technical Articles (2005) 7 (1): 16–24.
Published: 01 February 2005
... of the patterns that toggle each of the bits in scan chain <1> to the logic values needed. This effectively obtains the same result as plotting the deterministic drive-mapping patterns, but without doing the cone of logic extraction. The drive-bit mapping can come from studying the patterns themselves, because...
Journal Articles
EDFA Technical Articles (2016) 18 (4): 4–14.
Published: 01 November 2016
... IN SCAN CHAIN DIAGNOSIS HAS IMPROVED THE IN-LINE SCAN CHAIN LOGIC FAILURE ANALYSIS SUCCESS RATE TO THAT OF SRAM FAILURE ANALYSIS. LVI s unique capability to map the periodic signal[7-9] in a DUT makes it a great diagnostic technique for scan chain failure, whether the scan chain failure is due...
Journal Articles
EDFA Technical Articles (2018) 20 (2): 18–24.
Published: 01 May 2018
... is the primary choice for SRAM scan chain failures because it has the unique capability of mapping the periodic signal in a DUT. In this section, four cases of SRAM logic type failures are analyzed and the appropriate diagnostic techniques are presented. Fig. 7 SEM image showing a poly micro-mask, causing a poly...
Journal Articles
EDFA Technical Articles (2001) 3 (4): 21–26.
Published: 01 November 2001
... in the test vectors (Unknowns result from portions of the design that cannot be controlled by the scan vectors; common examples are RAM outputs, unscanned flip-flops, isolated latches, analog and asynchronous circuitry, and some pad wiring.) Complete logical to physical mapping; i.e. the ability to convert...
Journal Articles
EDFA Technical Articles (2007) 9 (1): 20–23.
Published: 01 February 2007
... crystal. Voltage contrast is typically a first-tier failure isolation technique useful in isolating problems to a specific circuit or circuit block. This is particularly valuable when there is a lack of circuit schematics, die maps, logic diagrams, or bit maps, which can severely limit the amount...
Journal Articles
EDFA Technical Articles (2018) 20 (1): 10–18.
Published: 01 February 2018
... at ISTFA 2014), logic-state mapping, and electroluminescence spectroscopy (ISTFA 2015). Laurent Clément obtained a Ph.D. in physics at the Atomic Energy Commissariat in 2006 and an engineer diploma in materials science at the Ecole Nationale Supérieure de Physique de Grenoble in 2011. He is currently...
Journal Articles
EDFA Technical Articles (2000) 2 (4): 13–16.
Published: 01 November 2000
... Cache SRAM in the CMOS6X process. It was necessary to run these bit fail maps in some cases at speeds faster than 1.5 ns cycle to capture memory cells failing due to the Holey Shmoo problem. The L1 Cache SRAM self-test logic is equipped with the circuitry necessary to supply onthe-fly fail data...
Journal Articles
EDFA Technical Articles (2012) 14 (4): 12–18.
Published: 01 November 2012
... occurs, the fail information is kept together with the fail address, which consists of the wordline address X and the bitline address Y, which implicitly includes the data line information. This fail information is visualized in bitmaps, with which a map of failing bits is shown. The coordinates...
Journal Articles
EDFA Technical Articles (2022) 24 (4): 12–21.
Published: 01 November 2022
... are consistently logic 1 and logic 0 for each power cycle. Different permutations of LUTs are used to increase the number of (Ci RCi) pairs. FPGAs give the flexibility to map different combinations of LUTs to form a single cross-coupled pair memory cell, and thus increase the total number of unique challenge...
Journal Articles
EDFA Technical Articles (2010) 12 (4): 12–20.
Published: 01 November 2010
...-in-voltage mode, the lock-in-current mode facilitates detection of periodic dynamic supply currents.[7] In CMOS logic chips, the transition edges lead to a main dynamic-current consumption. Therefore, the lock-in-current method, as a form of dynamic TLS, is more sensitive to problems occurring during...
Journal Articles
EDFA Technical Articles (2000) 2 (3): 1–10.
Published: 01 August 2000
... Roadmaps page 9) Introduction The data were taken on a 0.25 µm generation CMOS logic technology1 using active devices fabricated in dual wells with shallow trench isolation, complementary-doped gates, and source/ Fig. 1: Wafer map of fractional fallout in burn-in as a function of die location. The larger...
Journal Articles
EDFA Technical Articles (2006) 8 (2): 28–34.
Published: 01 May 2006
... to alternative approaches. The SASIC gate densities are similar to gate arrays and superior to that of FPGAs. There is no gate or area overhead for configuration logic, because configuration is implemented in the routing fabric itself, through the use of programmable vias or through the configuration...
Journal Articles
EDFA Technical Articles (2011) 13 (3): 12–16.
Published: 01 August 2011
...Roger Nicholson; Ted Lundquist Laser voltage imaging (LVI) enables the global visualization of on-chip circuit activity for the purpose of localizing defects. In a manner reminiscent of e-beam voltage contrast, it allows analysts to visually trace signals through circuit logic in order to see where...
Journal Articles
EDFA Technical Articles (2023) 25 (2): 44–46.
Published: 01 May 2023
... serving the FA market. Shorter term roadmaps are also being published by other FA Roadmap Councils. The FAFRC roadmap has six common elements between logic devices, memory devices, and packaging: (1) increased complexity due to expansion into the third dimension (3D); (2) introduction of new materials; (3...
Journal Articles
EDFA Technical Articles (2005) 7 (3): 14–21.
Published: 01 August 2005
... (VDS), gate-to-source voltage (VGS), and so on. These data provide unique possibilities for addressing such important issues as thermal mapping of microprocessors, device self-heating, cross-talk, and power noise measurements. Logic State Detection Figure 2 graphically illustrates the amount of LEOSLC...