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OBIC analysis

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Journal Articles
EDFA Technical Articles (2004) 6 (2): 21–27.
Published: 01 May 2004
.... It is possible to form the FOSSIL corresponding to an analysis point with an accuracy of 5 µm. Performance Experiments The degree of spatial resolution improvement through introduction of the FOSSIL was evaluated using a laser scanning microscope (LSM). Emission and OBIC images by IR-EMS and IR-OBIC techniques...
Journal Articles
EDFA Technical Articles (2001) 3 (4): 29–35.
Published: 01 November 2001
...J.M. Chin; M. Palaniappan; J.C.H. Phang; D.S.H. Chan; G. Gilfeather Single contact optical beam induced currents (SCOBIC) is a variation on the OBIC failure analysis technique that requires only one point of contact with the junction being examined. This article discusses the basic principles...
Journal Articles
EDFA Technical Articles (2017) 19 (3): 12–20.
Published: 01 August 2017
... 2.6 kV. Source: Figure from Ref 6, used with permission edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 19 NO. 3 14 measurement. Figure 4 shows a schematic of a diode undergoing an OBIC measurement: The diode is biased, a photon beam is scanned over the sample, and current Fig. 4 Schematic...
Journal Articles
EDFA Technical Articles (2001) 3 (4): 9–13.
Published: 01 November 2001
... inspection and failure analysis that can detect open, high-resistance, and shorted interconnects without electrical contact1-2. The basic idea is detection of the magnetic field produced by OBIC (optical beam induced current) using a DC-SQUID (superconducting quantum interference devices) magnetometer...
Journal Articles
EDFA Technical Articles (2001) 3 (1): 35–35C.
Published: 01 February 2001
... to confirm design failures and fixes Cross-section of bumps for material and defect characterization for root-cause failure analysis The paper presents a new OBIC silicon endpoint detection technique as integrated in the FC FIB system. The technique gives fine control to the residual silicon thickness...
Journal Articles
EDFA Technical Articles (2010) 12 (3): 44–47.
Published: 01 August 2010
... it was roughly ten years ago that I was putting the finishing touches on our first commercial laser signal injection microscope (LSIM). The research and development at that stage was fast and furious. Acronyms were flying off the research pages: OBIC (Fig. 1), LIVA, TIVA, OBIRCH, SCOBIC, RIL, SDL, to name a few...
Journal Articles
EDFA Technical Articles (2008) 10 (2): 12–18.
Published: 01 May 2008
..., and they dominate at the shorter laser wavelength (1.064 m). Various means are used to sense changes in the I-V characteristics produced by a SOM. Each has its own acronym, for example, optical beam induced current (OBIC), light-induced voltage alteration (LIVA), thermally induced voltage alteration (TIVA...
Journal Articles
EDFA Technical Articles (2000) 2 (1): 17–19.
Published: 01 February 2000
..., and vJcc VCTSa. For the fooner. light stimulus is needed 10 SCI up the failure conditIons. thus invasive lechniques such as OBiC and L1VA are ideal for faull isolalion. Ilowever, if the IC fails whcn dark, then a non-invasive lechnique such as cmissiOfl microscopy may be applicable. This case study belongs...
Journal Articles
EDFA Technical Articles (2002) 4 (2): 10–16.
Published: 01 May 2002
...)[5] and optical beam induced current (OBIC) imaging [6] in that the biased IC itself is the detector and amplifier. The signal that produces a CIVA image is the voltage of a constant current power supply used to bias the IC as an electron beam is scanned across the device surface. The primary...
Journal Articles
EDFA Technical Articles (2007) 9 (3): 18–20.
Published: 01 August 2007
... through the use of certain global techniques, such as OBIRCH, OBIC, SQUID, and PEM. There are cases when these global localization methods do not provide useable information that allows the analyst to narrow the search. In these cases, the divide-and-conquer approach can be useful. Figure 2 shows...
Journal Articles
EDFA Technical Articles (2005) 7 (2): 42–44.
Published: 01 May 2005
... failures. Established tools, such as OBIC, OBIRCH, LIVA, TIVA, and XIVA,[1,2] currently identify subtle defects through a form of laser stimulus. New tools, such as Moiré thermal pattern imaging, scintillation liquid crystal, stabilized fluorescence microthermal imaging, soft defect localization...
Journal Articles
EDFA Technical Articles (1998) 1 (1): 8–11.
Published: 01 November 1998
... of gate oxide defects. Generally, detect positions are pinpointed by such methods as functional tests, Emission Microscopy (EMS), and Optical Beam Induced Current (OBIC). These points are physically analyzed by direct observation with SEM, TEM, and other methods after deprocessing using chemical...
Journal Articles
EDFA Technical Articles (2000) 2 (1): 4–27.
Published: 01 February 2000
... and 10"0 measurements, and testing at other tCTllpemtures. TIlC diagnostk tce:hniqucs and physical analysis tools applied for these samples WCfC stuck·fault and delay test, IrlllQ. photon-emission-microscopy (PEM), liquid crystal. and optical beam induced current (OBIC). Summary of Failure Analysis...
Journal Articles
EDFA Technical Articles (2003) 5 (4): 13–24.
Published: 01 November 2003
... and not current imaging? Well, voltage shift imaging has two advantages over the direct imaging of the photocurrent (optical beam induced current, or OBIC). First, the IC acts as its own current-tovoltage amplifier, thus producing a much larger LIVA signal than a photocurrent signal. Second, IC voltage...
Journal Articles
EDFA Technical Articles (2021) 23 (3): 24–31.
Published: 01 August 2021
...., photon counting, OBIC/OBIRCH). Once again, this set-up is only for developing proof of concept. APPLICATION TO INVERTER CIRCUIT IN AN FPGA As a proof of concept, this process is applied to signals acquired from a Xilinx Kintex 7 FPGA[17] mounted on a Skoll Kintex 7 board from Numato Lab.[18] The DUT...