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FIB tunable circuits

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Journal Articles
EDFA Technical Articles (2004) 6 (2): 6–11.
Published: 01 May 2004
...Richard S. Flores This article explains how the addition of FIB tunable circuits in critical paths on ICs can alleviate some of the challenges encountered during the implementation of mixed-signal ASICs. It walks readers through the implementation of a particular digital ASIC, explaining where...
Journal Articles
EDFA Technical Articles (2019) 21 (4): 60–62.
Published: 01 November 2019
... Inc., a designer and manufacturer of imaging NEXAFS tools. Principe has authored two textbook chapters on FIB-Auger and FIB-based 3D nanotomographic reconstruction and co-authored the EDFAS Best Paper in 2013 and EDFAS Outstanding Paper in 2017. He holds two patents in FIB-based 3D reconstruction...
Journal Articles
EDFA Technical Articles (2017) 19 (1): 26–40.
Published: 01 February 2017
... technology presentation: infrared photo-induced force microscopy (IR PiFM). This is an atomic force sample-prep techniques: delayering, cross sectioning, and focused ion beam (FIB) circuit cut/edit, which are critical to the success of EBIC and EBAC analysis of ICs. microscopy (AFM)-based platform...
Journal Articles
EDFA Technical Articles (2003) 5 (2): 5–9.
Published: 01 May 2003
... well preclude the use of FIB, TEM, SEM, or x-rays, at least in non-destructive applications. The SPM (scanning probe microscope) and its derivatives are obvious alternatives for imaging defects. In fact, they are already in prevalent use on nanodevices. But their use necessitates surface exposure...