1-20 of 22 Search Results for

CCD camera

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles
EDFA Technical Articles (2019) 21 (3): 26–32.
Published: 01 August 2019
...Frieder H. Baumann Transmission electron microscopes have been improved in various ways over the past two decades, giving rise to new characterization techniques. Among the innovations discussed in this article are the introduction of field emission guns, the incorporation of CCD cameras and X-ray...
Journal Articles
EDFA Technical Articles (2016) 18 (1): 4–12.
Published: 01 February 2016
... study was done in case 1. Leakage was initially detected by using TLS (1 V/7 µA/integration time = 10 s). The aim of this study was to understand what type of defect can be detected by the cameras and to determine the detection threshold of silicon charge coupled device (Si-CCD) or InGaAs cameras...
Journal Articles
EDFA Technical Articles (2001) 3 (3): 1–23.
Published: 01 August 2001
..., the author describes the basic design of DUV microscopes, the role of major components, and their effect on imaging quality. Copyright © ASM International® 2001 2001 ASM International CCD camera condensing lenses deep ultraviolet microscopes laser sources objective lenses httpsdoi.org...
Journal Articles
EDFA Technical Articles (2000) 2 (2): 32–32B.
Published: 01 May 2000
..., the form of phase imaging known as Schlieren imaging offers extraordinary sensitivity using standard laser and high-resolution CCD camera components. Schlieren Imaging Classical Schlieren imaging uses a knife-edge to partially block the optical beam on its way to the image plane. In the upper illustration...
Journal Articles
EDFA Technical Articles (2019) 21 (1): 20–25.
Published: 01 February 2019
... and therefore the reflectivity of the material Fig. 1 MTTF versus device temperature, plotted for an activation energy of 1.84 eV. edfas.org Fig. 2 Key components comprising the microscope head with thermoreflectance thermal imaging: An Si CCD camera is used for illumination wavelengths in the visible range...
Journal Articles
EDFA Technical Articles (2018) 20 (1): 10–18.
Published: 01 February 2018
... location with a high-speed, high-resolution charge-coupled device (CCD) camera. Local orientation and phase information on polycrystalline materials can be extracted from diffraction spot positions. Approximately 50 NBD patterns are acquired over a line profile in the polysilicon of the reference...
Journal Articles
EDFA Technical Articles (2007) 9 (1): 14–18.
Published: 01 February 2007
... plate has a diameter of 0.2 mm capillary-discharge pumped neon-like argon laser and 625 zones, with a smaller 'r 50 nm. A thermo- was implemented that operates in both transmission electrically cooled CCD camera with a back-illumi- and reflection modes. This imaging system can render nated 2048 u 2048...
Journal Articles
EDFA Technical Articles (2000) 2 (4): 36–38.
Published: 01 November 2000
... order (emission spot) and higher diffracted order ( plus-minus ) components. The diffraction pattern is subsequently focused onto a cooled, CCD camera. Since the spectrometer uses a blazed transmission grating, most of the emission light intensity is concentrated within the plus first order...
Journal Articles
EDFA Technical Articles (2000) 2 (1): 10–14.
Published: 01 February 2000
... the itrulging characteristics of the DUV collcctor to the UV wavelength. As complicated as this may sound, it is a more simple and reliable solution as compared to using three lamp houses. Looking through the eyepiece in UV or OUV mode obviously does not make any sense. So, a CCD camera is needed. However...
Journal Articles
EDFA Technical Articles (2003) 5 (3): 13–20.
Published: 01 August 2003
... on Volume 5, No. 3 Electronic Device Failure Analysis 13 ABCs of Photon Emission Microscopy (continued) the detector, and a photon emission camera. For front side analysis, the most common cameras are generally cooled Si based CCD cameras. The system will also integrate an easy means for imaging. This may...
Journal Articles
EDFA Technical Articles (2013) 15 (1): 12–22.
Published: 01 February 2013
... with a chargecoupled device (CCD) camera in the optical assembly Fig. 1 Basic thermoreflectance imaging setup is located above the device under test (DUT), which is on the small X-Y table. An external light-emitting diode (LED) light source is attached beside the optics to illuminate the DUT. The entire setup...
Journal Articles
EDFA Technical Articles (2001) 3 (1): 20–23.
Published: 01 February 2001
... efficiency and better response to 1.0 µm, giving much higher sensitivity. Cooling the photocathode lowered the thermal noise generated in the photocathode, further enhancing the sensitivity. Astronomical grade CCD cameras today have higher spatial resolution (1.5 million pixels as opposed to 0.25 million...
Journal Articles
EDFA Technical Articles (2000) 2 (1): 20–23.
Published: 01 February 2000
... analysis system. and advanced IR Emission Microscope system lhal in· corporatcs not only a cooled Dual Scan CCD camera wilh super pixel readout capability, but also an IR (1.3 micron) confocal Laser Scanning Microscope to obtain high resolution. high dynamic range pauem images. The easy to operale Windows...
Journal Articles
EDFA Technical Articles (2004) 6 (3): 20–30.
Published: 01 August 2004
... device (CCD) camera (Hamamatsu Photonic Systems, Bridgewater, N.J.)9. The high quantum efficiency of the camera in the near-infrared region of the spectrum, combined with the thinning of the chip substrate down to approximately 100 µm, allow for an effective detection of the latchup light emission due...
Journal Articles
EDFA Technical Articles (2011) 13 (3): 4–11.
Published: 01 August 2011
...-measurement system based on fringe projection technology ( projection Moir1] The experimental setup is shown in Fig. 1. Structured light is directly projected on the sample s surface by means of a computer-driven projector, at a projection angle of 45°. The image is captured by a charge-coupled device (CCD...
Journal Articles
EDFA Technical Articles (2012) 14 (4): 4–11.
Published: 01 November 2012
... for studying near-midgap metallic contamination, thanks to the recent progress made in their development as well as their inherent high sensitivity to electrically active defects. While working on a memory project in 1969, George Smith and Willard Boyle invented the charge-coupled device (CCD) architecture...
Journal Articles
EDFA Technical Articles (2005) 7 (3): 14–21.
Published: 01 August 2005
... emitted by submicron transistors can be measured by means of NIR photodetectors such as charge-coupled device (CCD) cameras, photo multiplier tubes,[4] or single-point detectors such as the superconducting single photon detector[5,6] and the InGaAs avalanche photo diode.[7] Although the exact physical...
Journal Articles
EDFA Technical Articles (2019) 21 (2): 10–14.
Published: 01 May 2019
... Investigation of the Resolution and Dynamic Range of CCD-Based Thermoreflectance, J. Opt. Soc. Am. A., 2007, 24(4), pp. 1156-1163. 8. S. Choi, E.R. Heller, D. Dorsey, R. Vetury, and S. Graham: Thermometry of AlGaN/GaN HEMTs using Multispectral Raman Features, IEEE Trans. Electron Dev., 2013, 60(6), pp. 1898...
Journal Articles
EDFA Technical Articles (1999) 1 (3): 6–17.
Published: 01 August 1999
.... These deviations cause the image of the source and first knife-edge, which is formed at the position of the second knife edge in proportion to the local refractive index gradient. The target image formed on the CCD camera becomes a phase contrast image. Thermal gradients in the silicon produce refractive index...
Journal Articles
EDFA Technical Articles (2005) 7 (1): 26–32.
Published: 01 February 2005
... (CCD) camera. The microscope was used for the experiment in Ref 29 but is typical of x-ray microscopes. recent synchrotron experiment does not exhaust the potential of the technique.[28] However, phase retrieval requires coherent x-rays and hence 30 Electronic Device Failure Analysis Volume 7, No. 1...