About EDFA Technical Articles
Electronic Device Failure Analysis (EDFA) is a quarterly resource for the modern failure analysis professional. EDFA technical articles cover the latest techniques for the investigation, analysis, and prevention of microelectronic device failures. The publication was launched in 1998 as Electronic Device Failure Analysis News (EDFAN), a member benefit of the newly formed Electronic Device Failure Analysis Society (EDFAS). The transition to a magazine occurred with the November 2001 issue.
As the name suggests, the EDFA Technical Articles site includes the technical articles and selected columns and features published in EDFAN and EDFA. The coverage extends back to Volume 1, Issue 1; articles will be added to the site with the release of each new issue. The complete contents of recent issues—including the editorials, industry news, product news, and advertisements—are available to EDFAS members in “page flip” digital format at the EDFA Magazine site.
The current editor of EDFA, since February 2020, is Nicholas Antoniou. The past editors are
- Lawrence C. Wagner, November 1998 through February 2000
- Charles F. Hawkins, May 2000 through November 2003
- Edward I. Cole, Jr., February 2004 through November 2007
- Rosalinda M. Ring, February 2008 through November 2011
- Michael R. Bruce, February 2012 through November 2013
- Felix Beaudoin, February 2014 through November 2019
Other content resources in the ASM Digital Library related to electronic device failure analysis include ISTFA Proceedings (1996 to present) and the books Microelectronics Failure Analysis: Desk Reference, Seventh Edition, and STEM in SEM: Introduction to Scanning Transmission Electron Microscopy for Microelectronics Failure Analysis.
How to Purchase
Individual access to EDFA Technical Articles is a benefit of EDFAS membership. For information on corporate/institutional licenses, contact the ASM Online Database Manager:
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