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Issue
1 February - Volume 24, Issue 1, Pages 3 - 42
1 May - Volume 24, Issue 2, Pages 4 - 52
1 August - Volume 24, Issue 3, Pages 4 - 56
1 November - Volume 24, Issue 4, Pages 4 - 59
Volume 24, Issue 2
1 May 2022
ISSN 1537-0755
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Challenges for System Supplier Failure Analysis on Subsystem Components
Xuming Deng
;
Weidong Huang
;
Changhong Yu
;
Xiongjian Wu
;
Yang Xu
...
Abstract
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Nanoprobing at Low Beam Energy, Addressing Current and Future Nodes
Andreas Rummel
;
Andrew Jonathan Smith
Abstract
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A Strategic Review of Novel Sample Preparation Method for Dopant Profiling of Advanced Node FinFET Devices with Scanning Capacitance Microscopy
Nirmal Adhikari
;
Phil Kaszuba
;
Gaitan Mathieu
;
Daminda Dahanayaka
Abstract
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PDF
Physical Security Roadmap for Heterogeneous Integration Technology
Aslam A. Khan
;
Chengji Xi
;
Navid Asadizanjani
Abstract
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The EDFAS FA Technology Roadmap—Advancing Our Community
Nicholas Antoniou
Abstract
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The EDFAS FA Technology Roadmap—Foundation and Future
Security Assessment of Nonvolatile Memory Against Physical Probing
Processes for Thinning and Polishing Highly Warped Die to a Nearly Consistent Thickness: Part I
A Guide to Accurate System Calibration and Data Extraction to Increase Significance of Spectral Photon Emission Microscopy Measurements
Memometer: Memory PUF-based Hardware Metering Methodology for FPGAs
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