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Volume 19, Issue 4
1 November 2017
Issue Cover
ISSN 1537-0755
Failure Analysis of DC/DC Converters: A Case Study
Jérémie Dhennin
View articletitled, Failure Analysis of DC/DC Converters: A Case Study
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Nanoscale Capacitance and Capacitance-Voltage Curves for Advanced Characterization of Electrical Properties of Silicon and GaN Structures Using Scanning Microwave Impedance Microscopy (sMIM)
Oskar Amster; Stuart Friedman; Yongliang Yang; Fred Stanke
View articletitled, Nanoscale Capacitance and Capacitance-Voltage Curves for Advanced Characterization of Electrical Properties of Silicon and GaN Structures Using Scanning Microwave Impedance Microscopy (sMIM)
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Product Circuit Validation and Failure Debug: A Semiconductor Foundry Can Help
Edy Susanto; S.H. Goh; Edmund C. Manlangit; Jeffrey Lam
View articletitled, Product Circuit Validation and Failure Debug: A Semiconductor Foundry Can Help
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Plasma FIB Deprocessing of Integrated Circuits from the Backside
E.L. Principe; Navid Asadizanjani; Domenic Forte; Mark Tehranipoor; Robert Chivas ...
View articletitled, Plasma FIB Deprocessing of Integrated Circuits from the Backside
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Inventor’s Corner: A Vermont Farmer Walks into a Bar…
Dave Vallett
View articletitled, Inventor’s Corner: A Vermont Farmer Walks into a Bar…
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Speeding Up Failure Analysis Using Fab and Design Data
Rao Desineni; Yan Pan
View articletitled, Speeding Up Failure Analysis Using Fab and Design Data
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