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Issue
1 February - Volume 19, Issue 1, Pages 4 - 40
1 May - Volume 19, Issue 2, Pages 4 - 56
1 August - Volume 19, Issue 3, Pages 4 - 27
1 November - Volume 19, Issue 4, Pages 4 - 63
Volume 19, Issue 4
1 November 2017
ISSN 1537-0755
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Failure Analysis of DC/DC Converters: A Case Study
Jérémie Dhennin
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titled, Failure Analysis of DC/DC Converters: A Case Study
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Nanoscale Capacitance and Capacitance-Voltage Curves for Advanced Characterization of Electrical Properties of Silicon and GaN Structures Using Scanning Microwave Impedance Microscopy (sMIM)
Oskar Amster
;
Stuart Friedman
;
Yongliang Yang
;
Fred Stanke
Abstract
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titled, Nanoscale Capacitance and Capacitance-Voltage Curves for Advanced Characterization of Electrical Properties of Silicon and GaN Structures Using Scanning Microwave Impedance Microscopy (sMIM)
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Product Circuit Validation and Failure Debug: A Semiconductor Foundry Can Help
Edy Susanto
;
S.H. Goh
;
Edmund C. Manlangit
;
Jeffrey Lam
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titled, Product Circuit Validation and Failure Debug: A Semiconductor Foundry Can Help
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Plasma FIB Deprocessing of Integrated Circuits from the Backside
E.L. Principe
;
Navid Asadizanjani
;
Domenic Forte
;
Mark Tehranipoor
;
Robert Chivas
...
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titled, Plasma FIB Deprocessing of Integrated Circuits from the Backside
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Inventor’s Corner: A Vermont Farmer Walks into a Bar…
Dave Vallett
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titled, Inventor’s Corner: A Vermont Farmer Walks into a Bar…
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Speeding Up Failure Analysis Using Fab and Design Data
Rao Desineni
;
Yan Pan
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titled, Speeding Up Failure Analysis Using Fab and Design Data
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