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Issue
1 February - Volume 14, Issue 1, Pages 4 - 48
1 May - Volume 14, Issue 2, Pages 4 - 29
1 August - Volume 14, Issue 3, Pages 4 - 47
1 November - Volume 14, Issue 4, Pages 4 - 47
Volume 14, Issue 4
1 November 2012
ISSN 1537-0755
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Finding the Invisible Contaminants in CMOS Image Sensor Pixels: The DCS Technique
Florian Domengie
;
Pierre Morin
;
Daniel Bauza
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Review of Defect Localization Techniques for DRAMs
Martin Versen
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Photon Emission: A Technique Supposed to Fade Is Dying Really Hard
Christian Boit
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The EDFAS FA Technology Roadmap—Foundation and Future
Security Assessment of Nonvolatile Memory Against Physical Probing
Processes for Thinning and Polishing Highly Warped Die to a Nearly Consistent Thickness: Part I
A Guide to Accurate System Calibration and Data Extraction to Increase Significance of Spectral Photon Emission Microscopy Measurements
Memometer: Memory PUF-based Hardware Metering Methodology for FPGAs
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