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Issue
1 February - Volume 13, Issue 1, Pages 4 - 48
1 May - Volume 13, Issue 2, Pages 4 - 48
1 August - Volume 13, Issue 3, Pages 4 - 48
1 November - Volume 13, Issue 4, Pages 4 - 51
Volume 13, Issue 4
1 November 2011
ISSN
1537-0755
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What Is 3-D Test and How Do IEEE Standards Help?
Al Crouch
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Jennifer Dworak
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titled, SCM.SharedControls.Infrastructure.TitleDisplayModel?.Text
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Scanning Capacitance Microscopy (SCM) Applications in Failure Analysis
Xiang-Dong Wang
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EDFA 10-Year Anniversary: Newsletter Grows into a Magazine
Larry Wagner
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The Failure Analysis Lab behind the Foundry Business
Jones Chung
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A Novel Ion Microscope for High-Resolution Ion Imaging and SIMS Nanoanalytics with Precise Sample Navigation
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