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Issue
1 February - Volume 11, Issue 1, Pages 6 - 47
1 May - Volume 11, Issue 2, Pages 6 - 48
1 August - Volume 11, Issue 3, Pages 6 - 47
1 November - Volume 11, Issue 4, Pages 6 - 27
Volume 11, Issue 2
1 May 2009
ISSN
1537-0755
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Distortion-Free Measurements of Analog Circuits by Time-Resolved Emission
Keith R. Sarault
;
Gerben Boon
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titled, Distortion-Free Measurements of Analog Circuits by Time-Resolved Emission
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Fault Site Localization Technique by Imaging with Nanoprobes
Takeshi Nokuo
;
Hitoshi Furuya
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titled, Fault Site Localization Technique by Imaging with Nanoprobes
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Selective Dielectric Removal for Failure Analysis of Thin Films on Semiconductor Devices
Jason Benz
;
William Bentley
;
Joseph Myers
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titled, Selective Dielectric Removal for Failure Analysis of Thin Films on Semiconductor Devices
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Advanced Flash Memory Analysis
Keith Harber
;
Sam Subramanian
;
Tony Chrastecky
;
Kheim Ly
;
Charles Petri
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titled, Advanced Flash Memory Analysis
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Can Sisyphus Be Happy?
Philippe Perdu
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titled, Can Sisyphus Be Happy?
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Celebrating 50 Years of ISTFA
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Nondestructive 3D X-ray Microscopy Speeds Throughput in New Failure Analysis Workflows
Four-Dimensional Scanning Transmission Electron Microscopy: Part III, Ptychography
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