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Issue
1 February - Volume 10, Issue 1, Pages 6 - 47
1 May - Volume 10, Issue 2, Pages 6 - 44
1 August - Volume 10, Issue 3, Pages 6 - 48
1 November - Volume 10, Issue 4, Pages 6 - 35
Volume 10, Issue 4
1 November 2008
ISSN
1537-0755
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Complex Systems Failure Analysis Challenges
Patrick Poirier
;
Patrice Schwindenhammer
;
Alban Colder
;
Bernadette Domengès
;
Patrice Schwindenhammer
...
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Response to Counterfeit Integrated Circuit Components in the Supply Chain: Part I
Gary F. Shade
;
Brian Wilson
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Failure Analysis of X-Ray Flat Detector for Medical Imaging
Murielle Béranger
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3-D Through-Silicon Via Technology
E. Jan Vardaman
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EDFAS 10 Year Anniversary: A Look Back at EDFAN → EDFA
Larry Wagner
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A Novel Ion Microscope for High-Resolution Ion Imaging and SIMS Nanoanalytics with Precise Sample Navigation
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