Single contact optical beam induced currents (SCOBIC) is a variation on the OBIC failure analysis technique that requires only one point of contact with the junction being examined. This article discusses the basic principles of this new method and how it compares with OBIC in terms of measurement performance. It also presents examples showing how SCOBIC can be used to analyze CMOS devices from the front and back side without need for complex FIB and microprobing procedures.

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