The 40th International Symposium for Testing and Failure Analysis (ISTFA 2014) was held November 8 to 14, 2014, at the George R. Brown Convention Center in Houston, Texas. “Exploring the Many Facets of Failure Analysis,” the theme of ISTFA 2014, emphasized the diverse nature of semiconductor failure analysis in the 21st century. The technical sessions, keynotes, and tutorials at ISTFA 2014 covered a wide range of topics from fault isolation and sample prep to extreme environment failures and the birth of the digital signal processor.
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