Laser voltage imaging (LVI) enables the global visualization of on-chip circuit activity for the purpose of localizing defects. In a manner reminiscent of e-beam voltage contrast, it allows analysts to visually trace signals through circuit logic in order to see where faults occur. This article explains how laser voltage imaging works and how it is being used in semiconductor failure analysis. It also describes the types of applications for which LVI is not well suited.

This content is only available as a PDF.
You do not currently have access to this content.