This is the concluding portion of a two-part article on counterfeit ICs. The first part, published in the November 2008 issue of EDFA, discussed the rise of counterfeit ICs and some of the techniques used to identify them. Part II describes a process for device authentication, from material procurement to laboratory analysis, and provides examples of its use. It also discusses ongoing efforts to remove counterfeit ICs from the supply chain.

This content is only available as a PDF.
You do not currently have access to this content.