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ASM Handbook

Materials Characterization

Edited by
Ruth E. Whan
Ruth E. Whan
Sandia National Laboratories
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ASM International
Volume
10
ISBN electronic:
978-1-62708-178-8
Publication date:
1986
Book Chapter

X-Ray Diffraction Residual Stress Techniques

By
Paul S. Prevey
Paul S. Prevey
Lambda Research, Inc.
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Published:
1986
Page range:
380 - 392

Abstract

X-ray diffraction residual stress measurements are one of industry’s most versatile materials characterization tools. The procedure involves placing a known strain on a test sample and calculating the residual stress that would be required produce it, assuming a linear elastic distortion of the crystal lattice. This article describes the two most common x-ray diffraction measurement techniques based on the plane stress elastic model. It explains the difference between single and two-angle diffraction methods, and identifies potential sources of measurement error for each. The article also presents several application examples.

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Paul S. Prevey, 1986. "X-Ray Diffraction Residual Stress Techniques", Materials Characterization, Ruth E. Whan

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