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ASM Handbook

Materials Characterization

Edited by
Ruth E. Whan
Ruth E. Whan
Sandia National Laboratories
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ASM International
Volume
10
ISBN electronic:
978-1-62708-178-8
Publication date:
1986
Book Chapter

Introduction to Diffraction Methods

By
Deane K. Smith
Deane K. Smith
Department of Geosciences, The Pennsylvania State University
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Published:
1986
Page range:
325 - 332

Abstract

X-ray diffraction techniques are useful for characterizing crystalline materials, such as metals, intermetallics, ceramics, minerals, polymers, plastics, and other inorganic or organic compounds. This article discusses the theory of x-rays and how they are generated and detected. It also describes the crystalline nature of certain materials and how the geometry of a unit cell, and hence crystal lattice, affects the direction and intensity of diffracted x-ray beams. The article concludes with several application examples involving measurements on single and polycrystalline materials.

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Deane K. Smith, 1986. "Introduction to Diffraction Methods", Materials Characterization, Ruth E. Whan

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