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ASM Handbook

Materials Characterization

Edited by
Ruth E. Whan
Ruth E. Whan
Sandia National Laboratories
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ASM International
Volume
10
ISBN electronic:
978-1-62708-178-8
Publication date:
1986
Book Chapter

X-Ray Topography

By
Robert N. Pangborn
Robert N. Pangborn
Department of Engineering Science and Mechanics, The Pennsylvania State University
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Published:
1986
Page range:
365 - 379

Abstract

X-ray topography is a technique that comprises topography and x-ray diffraction. This article provides a description of the kinematical theory and the dynamical theory of diffraction. It provides useful information on the configurations of reflection and transmission topography. The article explains various topographic methods, namely, divergent beam method, polycrystal rocking curve analysis, line broadening analysis, microbeam method, and polycrystal scattering topography, as well as their instrumentation. It also describes the applications of x-ray topography.

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Robert N. Pangborn, 1986. "X-Ray Topography", Materials Characterization, Ruth E. Whan

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