Skip to Main Content
ASM Handbook

Materials Characterization

Edited by
Ruth E. Whan
Ruth E. Whan
Sandia National Laboratories
Search for other works by this author on:
ASM International
Volume
10
ISBN electronic:
978-1-62708-178-8
Publication date:
1986
Book Chapter

Particle-Induced X-Ray Emission

By
Thomas A. Cahill
Thomas A. Cahill
Crocker Nuclear Laboratory, University of California—Davis
Search for other works by this author on:
Published:
1986
Page range:
102 - 108

Abstract

Particle-induced x-ray emission (PIXE) is one of several quantitative analyses based on characteristic x-rays. This article provides a detailed account on the principles of PIXE, discussing the data-reduction codes used to identify, integrate, and reduce x-ray peaks into elemental concentrations. It provides information on the calibration of PIXE analysis, which is mostly performed using gravimetric standards to avoid serious absorption, refluorescence, or ion energy change corrections. A comparative study on PIXE and x-ray fluorescence is also included. Finally, the article discusses the applications of PIXE in three areas, namely, atmospheric physics and chemistry, external proton milliprobes and historical analysis, and PIXE microprobes.

You do not currently have access to this content.
Don't already have an account? Register

Thomas A. Cahill, 1986. "Particle-Induced X-Ray Emission", Materials Characterization, Ruth E. Whan

Download citation file:


×
Close Modal
This Feature Is Available To Subscribers Only

Sign In or Create an Account

Close Modal
Close Modal