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ASM Handbook

Fractography

By
ASM Handbook Committee
ASM Handbook Committee
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ASM International
Volume
12
ISBN electronic:
978-1-62708-181-8
Publication date:
1987
Book Chapter

Scanning Electron Microscopy

By
Barbara L. Gabriel
Barbara L. Gabriel
Packer Engineering Associates, Inc.
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Published:
1987
Page range:
166 - 178
Publication history
January 01, 1987

Abstract

Scanning electron microscopy (SEM) has unique capabilities for analyzing fracture surfaces. This article discusses the basic principles and practice of SEM, with an emphasis on its applications in fractography. The topics include an introduction to SEM instrumentation, imaging and analytical capabilities, specimen preparation, and the interpretation of fracture features. SEM can be subdivided into four systems, namely, illuminating/imaging, information, display, and vacuum systems. The article also describes the major criteria and techniques of SEM specimen preparation, and the general features of ductile and brittle fracture modes.

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Barbara L. Gabriel, 1987. "Scanning Electron Microscopy", Fractography, ASM Handbook Committee

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