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ASM Handbook

Metals Process Simulation

Edited by
D.U. Furrer
D.U. Furrer
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S.L. Semiatin
S.L. Semiatin
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ASM International
Volume
22B
ISBN electronic:
978-1-62708-197-9
Publication date:
2010
Book Chapter

Three-Dimensional Microstructure Representation

By
G. Spanos
G. Spanos
U.S. Naval Research Laboratory
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D.J. Rowenhorst
D.J. Rowenhorst
U.S. Naval Research Laboratory
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M.V. Kral
M.V. Kral
University of Canterbury
,
New Zealand
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P.W. Voorhees
P.W. Voorhees
Northwestern University
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D. Kammer
D. Kammer
Northwestern University
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Published:
2010
Page range:
100 - 114
Publication history
March 15, 2010

Abstract

This article reviews the characterization methods for producing 3-D microstructural data sets. The methods include serial sectioning by mechanical material removal method and focused ion beam tomography method. The article describes how these data sets are used in realistic 3-D simulations of microstructural evolution during materials processing and materials response. It also explains how the 3-D experimental data are actually input and used in the simulations using phase-field modeling and finite-element modeling.

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G. Spanos, D.J. Rowenhorst, M.V. Kral, P.W. Voorhees, D. Kammer, 2010. "Three-Dimensional Microstructure Representation", Metals Process Simulation, D.U. Furrer, S.L. Semiatin

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