Skip to Main Content
ASM Desk Editions

Metals Handbook Desk Edition

Edited by
Joseph R. Davis
Joseph R. Davis
Davis & Associates
Search for other works by this author on:
ASM International
ISBN electronic:
Publication date:
Book Chapter

Materials Characterization



This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy. It also describes capabilities, typical uses, spatial resolution, elemental analysis detection threshold and precision, limitations, sample requirements, and operating principles of the scanning auger microprobe.

You do not currently have access to this content.
Don't already have an account? Register

1998. "Materials Characterization", Metals Handbook Desk Edition, Joseph R. Davis

Download citation file:

Close Modal
This Feature Is Available To Subscribers Only

Sign In or Create an Account

Close Modal
Close Modal