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ASM Handbook

Metallography and Microstructures

Edited by
George F. Vander Voort
George F. Vander Voort
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ASM International
Volume
9
ISBN electronic:
978-1-62708-177-1
Publication date:
2004
Book Chapter

Light and Electron Microscopy[1]

By
Peter J. Goodhew
Peter J. Goodhew
University of Liverpool
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John Humphreys
John Humphreys
Manchester Materials Centre
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Richard Beanland
Richard Beanland
Marconi Materials Technology
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Published:
2004
Page range:
325 - 331
Publication history
November 01, 2004

Abstract

This article introduces the concepts of electron and light microscopy with some general features of imaging systems and the ideas of magnification, resolution, depth of field, depth of focus, and lens aberrations as they apply to simple and familiar light-optical systems. In addition, it describes the differences between electron and light in the context of their respective microscopy techniques.

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Peter J. Goodhew, John Humphreys, Richard Beanland, 2004. "Light and Electron Microscopy", Metallography and Microstructures, George F. Vander Voort

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