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ASM Handbook

Surface Engineering

Edited by
C.M. Cotell
C.M. Cotell
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J.A. Sprague
J.A. Sprague
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F.A. Smidt, Jr.
F.A. Smidt, Jr.
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ASM International
Volume
5
ISBN electronic:
978-1-62708-170-2
Publication date:
1994
Book Chapter

Testing and Characterization of Coatings and Thin Films

By
Gary E. McGuire
Gary E. McGuire
Microelectronics Center of North Carolina
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Published:
1994

Abstract

Measuring the thickness of thin films can be accomplished in many ways. This article focuses on the optical method of single-wavelength ellipsometry, two multiple-wavelength methods of reflectometry and spectroscopic ellipsometry for measuring the thickness of thin films. The general capabilities, principles and applications of ellipsometry and reflectometry are discussed in terms of nondestructive methods.

Abstract

This article focuses on the testing and typical corrosion behavior of coating-substrate systems in aqueous solutions and humid aggressive atmospheres. It includes a short review of the fundamentals of corrosion, followed by a discussion of specific system behavior, electrochemical and laboratory accelerated tests, and simulated service tests. The article also contains examples of different types of corrosion damage and presents guidelines for improving corrosion resistance.

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Gary E. McGuire, 1994. "Testing and Characterization of Coatings and Thin Films", Surface Engineering, C.M. Cotell, J.A. Sprague, F.A. Smidt, Jr.

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