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Search Results for scanning electron microscopy

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Journal Articles
AM&P Technical Articles (2017) 175 (2): 40–42.
Published: 01 February 2017
...Dheepa Srinivasan; GE Power In cold spray characterization, scanning electron microscopy is used to analyze feedstock powders for particle size, distribution, shape, and chemical composition prior to spraying. SEM is used extensively to characterize coating chemistry via energy-dispersive x-ray...
Journal Articles
AM&P Technical Articles (2025) 183 (4): 13–18.
Published: 01 May 2025
... fracture-resistant microstructures for offshore wind monopile applications. Using a multi-technique methodology spanning light microscopy, scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), energy dispersive X-ray spectroscopy (EDS), transmission electron microscopy (TEM...
Journal Articles
AM&P Technical Articles (2017) 175 (4): 28–31.
Published: 01 May 2017
...John Konopka Scanning electron microscopy and energy dispersive x-ray spectroscopy open new windows into glassmaking processes. Scanning electron microscopy and energy dispersive x-ray spectroscopy open new windows into glassmaking processes. Copyright © ASM International® 2017 2017...
Journal Articles
AM&P Technical Articles (2016) 174 (10): 22–25.
Published: 01 November 2016
... replaced, metallic alloy characterization using optical microscopy or scanning electron microscopy. Copyright © ASM International® 2016 2016 ASM International 3D laser scanning confocal microscopy erosion damage hardfacing alloys surface profiling httpsdoi.org/10.31399/asm.amp.2016-10.p022...
Journal Articles
AM&P Technical Articles (2019) 177 (6): 23–24.
Published: 01 September 2019
...Richard Ellsworth; Chris Spies Many broken parts look similar at a glance, but examination of the failed part using advanced equipment and methods such as scanning electron microscopy (SEM) reveals much more about the origins of the failure. This article presents a case history involving SEM...
Journal Articles
AM&P Technical Articles (2014) 172 (3): 28–31.
Published: 01 March 2014
...Susan Benes This article describes traditional methods for identifying particle contamination in manufacturing processes as well as a new alternative method that uses scanning electron microscopy combined with energy-dispersive x-ray spectroscopy. The new system provides efficient, accurate...
Journal Articles
AM&P Technical Articles (2016) 174 (4): 48.
Published: 01 April 2016
..., scanning electron microscopy, transmission elec- 2 X-ray diffraction phase formation, coating macroand microstrain, coating relaxation behavior, presence of any coating tron microscopy, electron backscatter diffraction, and electron texture probe microanalysis are integral to understanding the highly...
Journal Articles
AM&P Technical Articles (2017) 175 (4): 42–43.
Published: 01 May 2017
..., multiple splats, or the coating-substrate interface. FIB resembles scanning electron microscopy (SEM) except that instead of using a focused beam of electrons to raster the sample surface, it uses a focused beam of ions (usually gallium) either to image the sample (using low-beam currents) or to remove...
Journal Articles
AM&P Technical Articles (2023) 181 (1): 32–35.
Published: 01 January 2023
... micrograph showing fine Y-Ti-O particles present in a ferrite matrix. As can be seen, there are Y-Ti-O phases as small as 10 nm, which would not be visible with scanning electron microscopy. ATOM PROBE TOMOGRAPHY Atom probe tomography (APT) is widely used for phase identification. However, compared to SEM...
Journal Articles
AM&P Technical Articles (2022) 180 (1): 16–20.
Published: 01 January 2022
... a single weld bead microstructure is shown. Examination of the fracture using scanning electron microscopy (SEM) showed evidence of shear overload dimples in the form of directional microvoid coalescence, as depicted in Fig. 6. With the complementary use of CT methodology and traditional metallurgical...
Journal Articles
AM&P Technical Articles (2020) 178 (3): 26–29.
Published: 01 April 2020
... analysis nanostructured materials scanning electron microscopy ADVANCED MATERIALS & PROCESSES | APRIL 2020 httpsdoi.org/10.31399/asm.amp.2020-03.p026 26 TECHNICAL SPOTLIGHT ADVANCED MICROSCOPY TECHNIQUES FOR NEW INSIGHTS IN MATERIALS AND TECHNOLOGY New electrical, mechanical, and chemical testing...
Journal Articles
AM&P Technical Articles (2013) 171 (4): 21–24.
Published: 01 April 2013
... memory alloys scanning electron microscopy httpsdoi.org/10.31399/asm.amp.2013-04.p021 Quantitative Analysis of Phase Transformation in Ni-Ti Shape Memory Alloys M. Kimiecik*, J.W. Jones, FASM and S. Daly** University of Michigan Ann Arbor, Mich. Transformation heterogeneity in SMAs...
Journal Articles
AM&P Technical Articles (2015) 173 (2): 18–21.
Published: 01 February 2015
... Optical and scanning electron microscopy reveal that kink bands are responsible for the pronounced shape change that occurred during compression of the 65 nm specimen. Bright-field microscopy shows the absence of cracks along the kink bands (a). Sub-region of (a) imaged using circular differential...
Journal Articles
AM&P Technical Articles (2012) 170 (2): 24–26.
Published: 01 February 2012
... the on-site ore-analysis lab and conveyor belt environments. When coupled with x-ray diffraction (XRD) and/or quantitative evaluation of minerals by scanning electron microscopy (QEMSCAN/MLA), the analysis enables large improvements in ore control and process optimization. NIR in a mining production lab can...
Journal Articles
AM&P Technical Articles (2021) 179 (4): 25–27.
Published: 01 May 2021
... of this substructure, scanning electron microscopy is required[8,9]. However, by comparison with high- magnification polarized LM (Figs. 3e cases, grains cross over adjacent solid- and 3f), it can be observed that differ- ified melt pools. ently oriented cellular structures belong to different grains, in the case...
Journal Articles
AM&P Technical Articles (2015) 173 (9): 32–33.
Published: 01 October 2015
... inspection and scanning electron microscopy/energy dispersive x-ray spectroscopy (SEM-EDS) were initially used to study the failed pin (Fig. 1). Longitudinal fracture surfaces are shown in Fig. 2, with blue arrows indicating the fracture origin region and white arrows indicating the cracking direction...
Journal Articles
AM&P Technical Articles (2013) 171 (2): 20–22.
Published: 01 February 2013
... and to determine lattice expansion. Samples etched using Kalling s solution were analyzed using scanning electron microscopy and optical microscopy to confirm case depth. Magnetic force microscopy (MFM) was used to investigate near-surface properties of IH-PN treated material. The specimen is scanned twice...
Journal Articles
AM&P Technical Articles (2018) 176 (1): 27–30.
Published: 01 January 2018
... important for understanding air-ice-ocean interactions. MICROSCOPY TECHNIQUES Ice has been characterized using both optical microscopy and scanning electron microscopy (SEM) techniques. The grain structure of ice and c-axis direction can be determined optically: A thin section (0.5-1 mm thick) of ice...
Journal Articles
AM&P Technical Articles (2012) 170 (4): 17–21.
Published: 01 April 2012
...Matthew Olszta; Daniel Schreiber; Larry Thomas; Stephen Bruemmer Researchers at Pacific Northwest National Laboratory (PNNL) use a combination of scanning and transmission electron microscopy, atom probe tomography, and focused ion beam milling to analyze corrosion and crack structures in light...
Journal Articles
AM&P Technical Articles (2021) 179 (4): 62–65.
Published: 01 May 2021
... hardness and com- (a) 109 (b) 11 (c) (d) Fig. 2 (a) Conventional transmission electron microscopy bright field (CTEM-BF) image of the nitrided case region of a 1.57 wt% Si alloy. (b) Scanning transmission electron microscopy high angle annular dark field (STEM-HAADF) image showing amorphous Si containing...