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field emission SEM
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Journal Articles
AM&P Technical Articles (2014) 172 (2): 13–15.
Published: 01 February 2014
... field emission SEM grain mapping nanocrystalline materials transmission Kikuchi diffraction httpsdoi.org/10.31399/asm.amp.2014-02.p013 Transmission Kikuchi Diffraction in the Scanning Electron Microscope: Orientation Mapping on the Nanoscale Patrick W. Trimby Julie M. Cairney The University...
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By changing a setup and using electron transparent samples, hundreds of laboratories worldwide have access to a characterization technique, transmission Kikuchi diffraction, that measures grain sizes and orientations in nanocrystalline materials.
Journal Articles
AM&P Technical Articles (2012) 170 (6): 28–32.
Published: 01 June 2012
... progressed to a certain level, a region of interest might be examined by excising it using focussed ion beam (FIB), then the relationship between degradation and crystal orientation probed in 2D using electron backscatter diffraction (EBSD) in a field emission gun-scanning electron microscope (FEG-SEM...
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Optimizing the integrity and performance of highly engineered surfaces and structures requires the ability to visualize and understand material behavior over multiple length and time scales from a three-dimensional perspective. The Electron Microscopy Centre at the University of Manchester is equipped for such work as demonstrated in problem-solving scenarios involving multiscale imaging and analysis of the progression of intergranular corrosion in Al alloy 2024, the catalytic effect of silver nanoparticles in seawater, recrystallization in a volume element of a bronze alloy, and defect progression on graphene surfaces.
Journal Articles
AM&P Technical Articles (2019) 177 (1): 16–21.
Published: 01 January 2019
... STATISTICS FROM SEM IMAGING METHODS [a] Backscattered electron (BSE) Mean, µm 0.72 Standard deviation, µm 0.35 Minimum, µm 0.04 Maximum, µm 2.46 [a] Data from measurements from four random fields of view. Electron backscatter diffraction (EBSD) 0.74 0.41 0.04 3.23 TABLE 2 TIME AND COSTS FOR BSE AND EBSD...
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Advances in software algorithms and design enable automation of microstructure image analysis, leading to cost savings, reduction in measurement variability, and access to important metrics.
Journal Articles
AM&P Technical Articles (2014) 172 (7): 20–24.
Published: 01 July 2014
... structure with increased oxygen in the grain boundaries. used. Polished and etched samples were also observed in a Hitachi H-8500 field emission SEM. Residual Vickers microindentation hardness values were measured in a Struers Doramin A-300 digital test station. Oxygen content in the powder plays...
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The ability to make components from copper and copper alloys via additive manufacturing is spurring a range of novel applications. Although the high thermal conductivity of copper presents challenges for direct AM processes, fully dense copper components with complex geometries have been demonstrated. Of particular interest is the ability to use AM methods to fabricate internal cooling channels and mesh structures to optimize thermal management. This article describes feasibility studies to evaluate AM processing of copper parts.
Journal Articles
AM&P Technical Articles (2017) 175 (8): 37–38.
Published: 01 November 2017
...], and green to [101]. Characterization of the thermomechanical behavior of cold spray coatings has been carried out extensively using EBSD. Electron backscatter diffraction, in conjunction with field-emission gun SEM, provides insights into large areas of samples to elucidate the particle bonding, porosity...
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This article series explores the indispensable role of characterization in the development of cold spray coatings. Electron backscatter diffraction (EBSD) is a characterization technique that enables determination of crystal orientations, texture, boundary misorientations and deformation behavior, and bonding mechanism in cold spray coatings.
Journal Articles
AM&P Technical Articles (2015) 173 (9): 29–31.
Published: 01 October 2015
... microscopy is often used to further localize the problem. Optical and scanning electron microscope (SEM) inspection can also help analysts understand morphology and electrostatic discharge (ESD) issues, and can be combined with materials characterization tests to identify foreign materials or corrosive...
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Determining the root cause of avionics failures requires a disciplined and systematic analytical process supported by sophisticated equipment. This article reviews some of the analytical tools and techniques used to understand and prevent avionics failures.
Journal Articles
AM&P Technical Articles (2021) 179 (2): 19–22.
Published: 01 February 2021
... number of positions across multiple imaging fields (the field of view in an SEM is typically in the few mm range). In the presented case study, the weld specimen is a corner (fillet) weld between the vertical wall and the horizontal base plate (both SA-516 Grade 70 material) of the absorber vessel...
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Through a series of case studies, the benefits of micro x-ray fluorescence (XRF) over traditional XRF are demonstrated in the power generation industry for informing weld procedures, identifying root cause, and providing materials or component specifications.
Journal Articles
AM&P Technical Articles (2016) 174 (3): 24–28.
Published: 01 March 2016
... with secondary electron-emission contrast in the SEM images, showing significantly enhanced contrast for the Q-carbon. Controlling diamond nucleation and growth enables converting all the carbon into microdiamonds (500 nm average size) as shown in Fig. 2b. Formation of large-area single-crystal diamond films...
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The discovery of new phases of carbon and direct conversion of carbon into diamond and diamond-like materials—at ambient conditions and without a catalyst—is a breakthrough with tremendous potential for electronics and hard-materials applications.
Journal Articles
AM&P Technical Articles (2020) 178 (5): 15–19.
Published: 01 July 2020
...Soumya Mandal; Ritesh Sachan; Amit Pandey This article explains how SEM, TEM, and atom probe tomography are being used in the development of additively manufactured high-entropy alloys (HEAs), revealing critical features such as anisotropic microstructure and metallurgical defects. It also...
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This article explains how SEM, TEM, and atom probe tomography are being used in the development of additively manufactured high-entropy alloys (HEAs), revealing critical features such as anisotropic microstructure and metallurgical defects. It also discusses ongoing efforts to improve the predictability and analysis of HEA microstructure using data-driven approaches.
Journal Articles
AM&P Technical Articles (2016) 174 (10): 16–21.
Published: 01 November 2016
... ASM International® 2016 2016 ASM International atom probe tomography focused ion beam tomography neutron-irradiated Fe-Cr-Al alloys SEM fracture surface analysis small-angle neutron scattering TEM analysis MATERIALS TESTING/CHARACTERIZATION 1 6 httpsdoi.org/10.31399/asm.amp.2016-10.p016...
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Development of new, radiation-tolerant materials that maintain the structural integrity and safety margins over the course of a nuclear power reactor’s service life requires the ability to predict degradation phenomena. Modern post-irradiation examination methods make use of specialized high-flux test reactors and dedicated characterization facilities to limit occupational exposure and prevent the spread of radioactive contamination. This article illustrates the use of these advanced techniques to characterize precipitates in neutron-irradiated Fe-Cr-Al alloys.
Journal Articles
Hassina Z. Bilheux, R. Aaron Hanks, Jean-Christophe Bilheux, Harley Skorpenske, Mary-Ellen Donnelly ...
AM&P Technical Articles (2023) 181 (8): 18–23.
Published: 01 November 2023
... of Scanning Electron Microscopy (SEM), Scanning Microscopy for Nanotechnology: Techniques and Applications, p 1-40, 2007. 14. S.R. Spurgeon, et al., Towards Datadriven Next-generation Transmission Electron Microscopy, Nature Materials, 20(3), p 274-279, 2021. 15. M. Lucas and E. Riedo, Invited Review Article...
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Wavelength-dependent or hyperspectral imaging is a novel nondestructive characterization technique in the field of neutron radiography and computed tomography. A dedicated facility named VENUS is currently being built at Oak Ridge National Laboratory to provide these characterization capabilities for academia, industry, and other national laboratories. This feature article describes the VENUS capabilities for materials science and engineering, provides a quick overview of the modes of access of the facility, and illustrates the nondestructive measurements and interpretation of results.
Journal Articles
AM&P Technical Articles (2012) 170 (3): 19–23.
Published: 01 March 2012
...[18]; (c) SEM image of fractured surface showing NiTi SMA wires extending from the crack surface in a Sn-20% Bi matrix; (d) schematic of self-healing metal using an encapsulated low-melting point phase; and (e) aluminum composite containing quartz tubes filled with an aluminum brazing alloy[16]. UWM...
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Metal-matrix composite (MMC) materials are being developed at the University of Wisconsin-Milwaukee for a diverse range of automotive applications from pistons and cylinder liners to exhaust manifolds and chassis sections. The ability to tailor not only the properties but also the functionality of MMCs gives automotive engineers a powerful new tool in dealing with increasingly strict fuel economy standards.
Journal Articles
AM&P Technical Articles (2019) 177 (2): 22–26.
Published: 01 February 2019
... MoAlB, where PE MoAlB is obtained from etching MoAlB with 12M HCl. Figures 3(c1-c3) show SEM mi- In general, the addition of both MoAlB and PE MoAlB particulates improved mechanical properties and ductility of the composites (Figs. 4a-d). For example, tensile strength increased by 1.4 times to ~71 MPa...
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Molybdenum aluminum boride (MAB) phases have layered nanolaminate structures, suiting them for potential use in cutting tools, leading edges for hypersonic vehicles, high-temperature electrodes, and other demanding applications. This case study demonstrates a process for the production of MoAlB particulates and their incorporation in polymer-matrix composites.
Journal Articles
AM&P Technical Articles (2012) 170 (4): 22–27.
Published: 01 April 2012
..., and the adhesion of a single CNC on Si substrate grown by plasma enhanced chemical vapor deposition[5]. Nano-scratch tests were performed using a normal load of 150 N with other details similar to the previous two case studies. Figure 6 shows plots and respective SEM images of scratch distance versus lateral...
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Nano-scratch testing can be tailored to quantify the adhesion strength of small-scale surface formations, deposits, and structures on a wide range of materials. This article describes the basic measurement technique and presents examples showing how it has been used to evaluate the bonding characteristics of plasma-sprayed Al 2 O 3 splats on steel, osteoblast cells on hydroxyapatite-based coatings, and carbon nanotubes on copper and silicon substrates.
Journal Articles
AM&P Technical Articles (2022) 180 (3): 63–70.
Published: 01 April 2022
... Materials Education Foundation ASM Scanning Electron Microscopy: Online Course with Lab Option In collaboration with Zeiss, ASM presents the new online course Scanning Electron Micros- copy (SEM). The class presents basic SEM theory and operating principles along with imaging and analytical techniques...
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News about ASM members, chapters, events, awards, conferences, affiliates, and other society activities. Topics include: ASM technical committees update; volunteer profile for Dana Drake; women in engineering profile for Mary O'Brien.
Journal Articles
AM&P Technical Articles (2014) 172 (6): 51–58.
Published: 01 June 2014
.... Recognized as an outstanding young metallurgist, she was the 1995 recipient of the chapter s ASM Alfred H. Geisler Memorial Award. Dannemann also held numerous leadership positions in other technical societies including TMS, the Society for Experimental Mechanics (SEM), and the Society of Women Engineers...
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News about ASM members, chapters, events, awards, conferences, affiliates, and other society activities. Topics include: ASM Board nominees for 2014-2015 announced; profile of Valery Rudnev, editor of ASM Handbook, Volume 4C, Induction Heating and Heat Treatment; volunteer profile for Bob Gaster.
Journal Articles
AM&P Technical Articles (2012) 170 (8): 53–59.
Published: 01 August 2012
... complex sys- and depth can help represent 3-D objects truthfully in two di- tems and processes visually. A picture is worth a thousand mensions. These tips can be particularly helpful when imaging words, but a confusing image or cluttered report can lead to a fracture surfaces on the SEM. Special Call...
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News about ASM members, chapters, events, awards, conferences, affiliates, and other society activities. Topics include: 2012 ASM Awards Recipients and volunteer profile for Beth Armstrong, Oak Ridge National Laboratory.
Journal Articles
AM&P Technical Articles (2021) 179 (5): 20–23.
Published: 01 July 2021
... plate. Samples were imaged using an FEI Teneo LoVac field-emission scanning electron microscope (SEM). Images were then analyzed using MIPAR image analysis software. Analysis of internal planes of the samples resulted in the spherical (gas) pore data presented in Table 1 and Figs. 1 and 2. The raster...
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The fraction and size of pores present in EBM Ti-6Al-4V specimens varies depending on the melting strategy used, whether linear raster melting or point melting.
Journal Articles
AM&P Technical Articles (2023) 181 (7): 12–17.
Published: 01 October 2023
... understanding of the microstructural nature of aging through the formation of precipitates was critical to selecting proper pretest heat treatments. Microstructural 13 investigation of the samples with an SEM and a TEM was critical to determining that the precipitation heat treatments indeed produced...
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To learn about the important connection between mechanical engineering and materials science, we turned to five experts with backgrounds in both fields for insight. The panelists share their perspectives on how the two disciplines informed their careers, which types of design challenges can be solved with materials information, and how ASM can improve that connection by leading with a “unity of disciplines” approach. The panelists are Scott Carpenter, Vactronix Scientific; Bertrand Jodoin, University of Ottawa; Vistasp Karbhari, The University of Texas at Arlington; Marina B. Ruggles-Wrenn, Air Force Institute of Technology; and Judith A. Todd, The Pennsylvania State University.
Journal Articles
AM&P Technical Articles (2015) 173 (8): 59–67.
Published: 01 September 2015
... for all aspects of SEM and TEM imaging and analytical techniques, electron-probe microanalysis, atom probe, Auger electron spectroscopy, XPS, and more. Updated content and new application examples are also sought for other surface analysis methods, thermal analysis (DSC, TGA, DMA, TMA), x-ray spectroscopy...
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News about ASM members, chapters, events, awards, conferences, affiliates, and other society activities. Topics include: 2015 class of ASM Fellows; ASM holds its first-ever Affiliate Summit in July 2015; spotlight for ASM Handbook, Volume 7 editors Prasan Samal and Joseph Newkirk.