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field emission SEM

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Journal Articles
AM&P Technical Articles (2014) 172 (2): 13–15.
Published: 01 February 2014
... field emission SEM grain mapping nanocrystalline materials transmission Kikuchi diffraction httpsdoi.org/10.31399/asm.amp.2014-02.p013 Transmission Kikuchi Diffraction in the Scanning Electron Microscope: Orientation Mapping on the Nanoscale Patrick W. Trimby Julie M. Cairney The University...
Journal Articles
AM&P Technical Articles (2012) 170 (6): 28–32.
Published: 01 June 2012
... progressed to a certain level, a region of interest might be examined by excising it using focussed ion beam (FIB), then the relationship between degradation and crystal orientation probed in 2D using electron backscatter diffraction (EBSD) in a field emission gun-scanning electron microscope (FEG-SEM...
Journal Articles
AM&P Technical Articles (2019) 177 (1): 16–21.
Published: 01 January 2019
... STATISTICS FROM SEM IMAGING METHODS [a] Backscattered electron (BSE) Mean, µm 0.72 Standard deviation, µm 0.35 Minimum, µm 0.04 Maximum, µm 2.46 [a] Data from measurements from four random fields of view. Electron backscatter diffraction (EBSD) 0.74 0.41 0.04 3.23 TABLE 2 TIME AND COSTS FOR BSE AND EBSD...
Journal Articles
AM&P Technical Articles (2014) 172 (7): 20–24.
Published: 01 July 2014
... structure with increased oxygen in the grain boundaries. used. Polished and etched samples were also observed in a Hitachi H-8500 field emission SEM. Residual Vickers microindentation hardness values were measured in a Struers Doramin A-300 digital test station. Oxygen content in the powder plays...
Journal Articles
AM&P Technical Articles (2017) 175 (8): 37–38.
Published: 01 November 2017
...], and green to [101]. Characterization of the thermomechanical behavior of cold spray coatings has been carried out extensively using EBSD. Electron backscatter diffraction, in conjunction with field-emission gun SEM, provides insights into large areas of samples to elucidate the particle bonding, porosity...
Journal Articles
AM&P Technical Articles (2015) 173 (9): 29–31.
Published: 01 October 2015
... microscopy is often used to further localize the problem. Optical and scanning electron microscope (SEM) inspection can also help analysts understand morphology and electrostatic discharge (ESD) issues, and can be combined with materials characterization tests to identify foreign materials or corrosive...
Journal Articles
AM&P Technical Articles (2021) 179 (2): 19–22.
Published: 01 February 2021
... number of positions across multiple imaging fields (the field of view in an SEM is typically in the few mm range). In the presented case study, the weld specimen is a corner (fillet) weld between the vertical wall and the horizontal base plate (both SA-516 Grade 70 material) of the absorber vessel...
Journal Articles
AM&P Technical Articles (2016) 174 (3): 24–28.
Published: 01 March 2016
... with secondary electron-emission contrast in the SEM images, showing significantly enhanced contrast for the Q-carbon. Controlling diamond nucleation and growth enables converting all the carbon into microdiamonds (500 nm average size) as shown in Fig. 2b. Formation of large-area single-crystal diamond films...
Journal Articles
AM&P Technical Articles (2020) 178 (5): 15–19.
Published: 01 July 2020
...Soumya Mandal; Ritesh Sachan; Amit Pandey This article explains how SEM, TEM, and atom probe tomography are being used in the development of additively manufactured high-entropy alloys (HEAs), revealing critical features such as anisotropic microstructure and metallurgical defects. It also...
Journal Articles
AM&P Technical Articles (2016) 174 (10): 16–21.
Published: 01 November 2016
... ASM International® 2016 2016 ASM International atom probe tomography focused ion beam tomography neutron-irradiated Fe-Cr-Al alloys SEM fracture surface analysis small-angle neutron scattering TEM analysis MATERIALS TESTING/CHARACTERIZATION 1 6 httpsdoi.org/10.31399/asm.amp.2016-10.p016...
Journal Articles
AM&P Technical Articles (2023) 181 (8): 18–23.
Published: 01 November 2023
... of Scanning Electron Microscopy (SEM), Scanning Microscopy for Nanotechnology: Techniques and Applications, p 1-40, 2007. 14. S.R. Spurgeon, et al., Towards Datadriven Next-generation Transmission Electron Microscopy, Nature Materials, 20(3), p 274-279, 2021. 15. M. Lucas and E. Riedo, Invited Review Article...
Journal Articles
AM&P Technical Articles (2012) 170 (3): 19–23.
Published: 01 March 2012
...[18]; (c) SEM image of fractured surface showing NiTi SMA wires extending from the crack surface in a Sn-20% Bi matrix; (d) schematic of self-healing metal using an encapsulated low-melting point phase; and (e) aluminum composite containing quartz tubes filled with an aluminum brazing alloy[16]. UWM...
Journal Articles
AM&P Technical Articles (2019) 177 (2): 22–26.
Published: 01 February 2019
... MoAlB, where PE MoAlB is obtained from etching MoAlB with 12M HCl. Figures 3(c1-c3) show SEM mi- In general, the addition of both MoAlB and PE MoAlB particulates improved mechanical properties and ductility of the composites (Figs. 4a-d). For example, tensile strength increased by 1.4 times to ~71 MPa...
Journal Articles
AM&P Technical Articles (2012) 170 (4): 22–27.
Published: 01 April 2012
..., and the adhesion of a single CNC on Si substrate grown by plasma enhanced chemical vapor deposition[5]. Nano-scratch tests were performed using a normal load of 150 N with other details similar to the previous two case studies. Figure 6 shows plots and respective SEM images of scratch distance versus lateral...
Journal Articles
AM&P Technical Articles (2022) 180 (3): 63–70.
Published: 01 April 2022
... Materials Education Foundation ASM Scanning Electron Microscopy: Online Course with Lab Option In collaboration with Zeiss, ASM presents the new online course Scanning Electron Micros- copy (SEM). The class presents basic SEM theory and operating principles along with imaging and analytical techniques...
Journal Articles
AM&P Technical Articles (2014) 172 (6): 51–58.
Published: 01 June 2014
.... Recognized as an outstanding young metallurgist, she was the 1995 recipient of the chapter s ASM Alfred H. Geisler Memorial Award. Dannemann also held numerous leadership positions in other technical societies including TMS, the Society for Experimental Mechanics (SEM), and the Society of Women Engineers...
Journal Articles
AM&P Technical Articles (2012) 170 (8): 53–59.
Published: 01 August 2012
... complex sys- and depth can help represent 3-D objects truthfully in two di- tems and processes visually. A picture is worth a thousand mensions. These tips can be particularly helpful when imaging words, but a confusing image or cluttered report can lead to a fracture surfaces on the SEM. Special Call...
Journal Articles
AM&P Technical Articles (2021) 179 (5): 20–23.
Published: 01 July 2021
... plate. Samples were imaged using an FEI Teneo LoVac field-emission scanning electron microscope (SEM). Images were then analyzed using MIPAR image analysis software. Analysis of internal planes of the samples resulted in the spherical (gas) pore data presented in Table 1 and Figs. 1 and 2. The raster...
Journal Articles
AM&P Technical Articles (2023) 181 (7): 12–17.
Published: 01 October 2023
... understanding of the microstructural nature of aging through the formation of precipitates was critical to selecting proper pretest heat treatments. Microstructural 13 investigation of the samples with an SEM and a TEM was critical to determining that the precipitation heat treatments indeed produced...
Journal Articles
AM&P Technical Articles (2015) 173 (8): 59–67.
Published: 01 September 2015
... for all aspects of SEM and TEM imaging and analytical techniques, electron-probe microanalysis, atom probe, Auger electron spectroscopy, XPS, and more. Updated content and new application examples are also sought for other surface analysis methods, thermal analysis (DSC, TGA, DMA, TMA), x-ray spectroscopy...