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Atom probe tomography
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Journal Articles
AM&P Technical Articles (2025) 183 (1): 25–28.
Published: 01 January 2025
Abstract
View articletitled, Unlocking the Potential of High-Entropy Alloys with Advanced Characterization Techniques
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for article titled, Unlocking the Potential of High-Entropy Alloys with Advanced Characterization Techniques
As high-entropy alloys become more complex in terms of microstructure, phase stability, and intermetallics, the advent of sophisticated analytical instruments is helping scientists to develop new materials with the most desirable properties. The analysis techniques described in this article include electron energy loss spectroscopy, electron probe microanalysis, atom probe tomography, and x-ray absorption spectroscopy.
Journal Articles
AM&P Technical Articles (2023) 181 (1): 32–35.
Published: 01 January 2023
Abstract
View articletitled, Phase Analysis Primer: How to Select the Right Analytical Technique
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for article titled, Phase Analysis Primer: How to Select the Right Analytical Technique
This article reviews the analytical techniques used for phase identification in components, including x-ray diffraction, metallography/microscopy, electron backscatter diffraction, trasmission electron microscopy,and atom probe tomography. The article addresses the advantages and disadvantages of each technique compared to the other approaches.
Journal Articles
AM&P Technical Articles (2021) 179 (4): 62–65.
Published: 01 May 2021
Abstract
View articletitled, The Case for Advanced Characterization to Better Understand Surface Hardening of Steels
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for article titled, The Case for Advanced Characterization to Better Understand Surface Hardening of Steels
Using advanced characterization techniques on surface hardened steels builds a richer understanding of the underlying metallurgical phenomena.
Journal Articles
AM&P Technical Articles (2020) 178 (5): 15–19.
Published: 01 July 2020
Abstract
View articletitled, Advances in HEA-Based AM Components: Role of High-Resolution Microscopy
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for article titled, Advances in HEA-Based AM Components: Role of High-Resolution Microscopy
This article explains how SEM, TEM, and atom probe tomography are being used in the development of additively manufactured high-entropy alloys (HEAs), revealing critical features such as anisotropic microstructure and metallurgical defects. It also discusses ongoing efforts to improve the predictability and analysis of HEA microstructure using data-driven approaches.
Journal Articles
AM&P Technical Articles (2012) 170 (4): 17–21.
Published: 01 April 2012
Abstract
View articletitled, High-Resolution Crack Imaging Reveals Degradation Processes in Nuclear Reactor Structural Materials
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for article titled, High-Resolution Crack Imaging Reveals Degradation Processes in Nuclear Reactor Structural Materials
Researchers at Pacific Northwest National Laboratory (PNNL) use a combination of scanning and transmission electron microscopy, atom probe tomography, and focused ion beam milling to analyze corrosion and crack structures in light-water reactor components with near-atomic spatial resolution.