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1 January - Volume 178, Issue 1, Pages 16 - 46
1 February - Volume 178, Issue 2, Pages 16 - 62
1 April - Volume 178, Issue 3, Pages 16 - 78
1 May - Volume 178, Issue 4, Pages 15 - 78
1 July - Volume 178, Issue 5, Pages 15 - 77
1 September - Volume 178, Issue 6, Pages 16 - 62
1 October - Volume 178, Issue 7, Pages 12 - 53
1 November - Volume 178, Issue 8, Pages 15 - 78
Volume 178, Issue 1
1 January 2020
ISSN
0882-7958
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Using 3D Characterization and Serial Sectioning to Improve Materials Analysis
Thomas A. Ivanoff
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Jonathan D. Madison
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titled, SCM.SharedControls.Infrastructure.TitleDisplayModel?.Text
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2019-2020 President of ASM International Zi-Kui Liu
John Ågren
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Technical Spotlight
Next-Gen Color Technology Changes How Materials are Characterized
Ernst Jan Vesseur
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Technical Spotlight
Processing Breakthrough Improves Titanium Yield
Kurt Faller
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Single-Crystal X-Ray Diffraction
Vladislav V. Gurzhiy
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ASM News
ASM News for January 2020
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Hardness Testers: Know the Options for Best Results
Scale-Bridging Characterization of Acicular Ferrite Nucleation
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Students from Japan and Finland Collaborate on Startup Project
Forensic Metallurgy in Archaeology and Aerospace
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