This article reviews the analytical techniques used for phase identification in components, including x-ray diffraction, metallography/microscopy, electron backscatter diffraction, trasmission electron microscopy,and atom probe tomography. The article addresses the advantages and disadvantages of each technique compared to the other approaches.

atom probe tomography, electron backscatter diffraction, phase analysis, transmission electron microscopy, X-ray diffraction
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2023
ASM International
Topics
Transmission electron microscopy Atom probe tomography Electron backscatter diffraction X-ray diffraction Phase constituents
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