Advances in HEA-Based AM Components: Role of High-Resolution Microscopy

This article explains how SEM, TEM, and atom probe tomography are being used in the development of additively manufactured high-entropy alloys (HEAs), revealing critical features such as anisotropic microstructure and metallurgical defects. It also discusses ongoing efforts to improve the predictability and analysis of HEA microstructure using data-driven approaches.