Cold Spray: Advanced Characterization Methods—Focused Ion Beam Machining and Electron Probe Microanalysis Available to Purchase

Focused ion beam (FIB) systems are selectively used in cold spray coating characterization to gather information on the nature of splat formation, single splats, multiple splats, or the coating-substrate interface. Electron probe microanalysis has been used in cold-sprayed coating characterization primarily to understand the bonding mechanism at the coating-substrate interface.