As today's electronics systems continue to shrink and become more complex and pervasive, failures can cause costly downtime, product delays and recalls, and debilitating reputational damage. Finding and fixing failures before they do damage is important, but becomes increasingly challenging when devices are built using ever more complex designs. The solution is to employ a comprehensive, multidisciplinary approach to electronic system failure analysis. In addition, many failures can be avoided altogether by thorough testing, coupled with the latest focused ion beam circuit edit techniques. These advanced methods quickly and inexpensively debug and validate design fixes or explore design optimization opportunities in integrated circuits without having to commit to costly and time-consuming full mask spins.

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