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Search Results for high angle annular dark field imaging

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Proceedings Papers

AM-EPRI2016, Advances in Materials Technology for Fossil Power Plants: Proceedings from the Eighth International Conference, 568-580, October 11–14, 2016,
... in a significant increase in time to failure. In order to investigate the effect of the processing route on microstructural evolution during aging and creep, a range of advanced electron microscopy techniques have been used including ion beam induced secondary electron imaging and High Angle Annular Dark Field...
Proceedings Papers

AM-EPRI2016, Advances in Materials Technology for Fossil Power Plants: Proceedings from the Eighth International Conference, 1027-1035, October 11–14, 2016,
... in scanning TEM (STEM) mode applying a high angle annular dark field (HAADF) detector. All TEM lamellae were prepared by a Zeiss Auriga cross beam focused ion beam (FIB) with Gaion beam. The thickness of the lamellae was approx. 150 nm with a size of approx. 10 × 10 µm. 1028 HR-FESEM High resolution field...
Proceedings Papers

AM-EPRI2019, 2019 Joint EPRI – 123HiMAT International Conference on Advances in High-Temperature Materials, 703-714, October 21–24, 2019,
... detector and a Fischione High-Angle Annular Dark-Field (HAADF) STEM detector. An Oxford Instruments X-Max 80mm2 windowless EDS detector was used to perform chemical analysis. Sample preparation for examination in the TEM was performed following a focused ion beam insitu lift-out procedure over specific...
Proceedings Papers

AM-EPRI2013, Advances in Materials Technology for Fossil Power Plants: Proceedings from the Seventh International Conference, 1104-1115, October 22–25, 2013,
.... The transformation process was examined on carbon extraction replica, with High Angle Annular Dark Field (HAADF) using a FEI Titan 80-300ST TEM with CEOS CESCOR probe spherical aberration corrector. RESULTS Precipitation rate The 12CrVNbN and 9CrVNbN alloys are identical except for the Cr content, and were designed...
Proceedings Papers

AM-EPRI2019, 2019 Joint EPRI – 123HiMAT International Conference on Advances in High-Temperature Materials, 1109-1122, October 21–24, 2019,
... of the carbides precipitates and sub-grains. The evolution of creep voids, carbide precipitates, and dislocation networks during welding operation and creep test was studied on both weld joints made with P91 and X20 weld fillers on the creep aged X20 and new P91 materials. Low angle annular dark-field (ADF...
Proceedings Papers

AM-EPRI2007, Advances in Materials Technology for Fossil Power Plants: Proceedings from the Fifth International Conference, 645-657, October 3–5, 2007,
... of clustered particles or perhaps large particles in the range of 10-20nm. Primarily the use of EDX and HAADF (High-Angle Annular Dark-Field) methods within the STEM produced micrographs confirming the presence of the heavy hafnium element within these particles, as is observed by the brighter colour in Figure...
Proceedings Papers

AM-EPRI2019, 2019 Joint EPRI – 123HiMAT International Conference on Advances in High-Temperature Materials, 1270-1281, October 21–24, 2019,
... mapping and 20 nm for EDS analysis can be obtained using this SEM-based technique. A total of 2x (10 µm x 10 µm) areas were analyzed using a step size of 20 nm from each weldment region. Annular dark field scanning transmission electron microscopy (ADF-STEM) (collection angle: 18 47 mRad) at 200 kV...
Proceedings Papers

AM-EPRI2024, Advances in Materials, Manufacturing, and Repair for Power Plants: Proceedings from the Tenth International Conference, 159-170, February 25–28, 2025,
..., 650MPa, a) and b) BSE-SEM micrographs in the rupture area highlighting cracking at grain boundary, c) high-angle annular dark-field (HAADF) STEM and associated composition maps Figure 5: As-printed LPBF 718 specimen creep tested at 650°C, 650MPa, a) and b) BSE-SEM micrographs in the rupture area...
Proceedings Papers

AM-EPRI2016, Advances in Materials Technology for Fossil Power Plants: Proceedings from the Eighth International Conference, 1182-1193, October 11–14, 2016,
... electrons was conducted on the etched surfaces of the bulk and FGHAZ regions at 10 000x. Site specific sampling was done using a focused ion beam (FIB)-SEM. Thin lamellas (5x5x0.1µm) was removed from the BULK and FGHAZ regions and imaged using annular dark field (ADF) scanning transmission electron...