About ISTFA Proceedings
The International Symposium for Testing and Failure Analysis (ISTFA) is the premier event for scientists and engineers who work to evaluate failures and improve the performance and reliability of semiconductor devices and processing techniques. The ISTFA conference traces its origins to the 1970s. The conference was acquired by ASM International in 1986 and has been sponsored by ASM ever since.
In 1998, the ISTFA Steering Committee proposed, and the ASM Board approved, the formation of a new ASM affiliate society, the Electronic Device Failure Analysis Society (EDFAS). While EDFAS now offers a full complement of content, networking, and education offerings, the ISTFA event remains its cornerstone offering.
For information on upcoming ISTFA conferences, visit the EDFAS events home page.
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