International Symposium for Testing and Failure Analysis

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The International Symposium for Testing and Failure Analysis is the premier event for scientists and engineers who work to evaluate failures and improve the performance and reliability of semiconductor devices and processing techniques.

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Enabling Cell Aware Diagnosis in a Foundry for Accurate and Efficient Failure Analysis of Cell Internal Defects

Nano-Indentation for Evaluating Low-K Dielectric Adhesion

Failure Analysis of Total-Dose Radiation-Induced Degradation on FinFET Logic ICs

On Debugging Intermittent Chain Hold-time Failures Caused by Process Variations for FinFET Technology

Fault Isolation using Layout Pattern Analysis

Latest Proceedings in ISTFA

ISTFA 2020

ISTFA 2018

ISTFA 2017

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